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Results:
1-14
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Results: 14
Authors:
Quaade, UJ
Stokbro, K
Lin, R
Grey, F
Citation: Uj. Quaade et al., Single-atom reversible recording at room temperature, NANOTECHNOL, 12(3), 2001, pp. 265-272
Authors:
Boggild, P
Hansen, TM
Tanasa, C
Grey, F
Citation: P. Boggild et al., Fabrication and actuation of customized nanotweezers with a 25 nm gap, NANOTECHNOL, 12(3), 2001, pp. 331-335
Authors:
Hasegawa, S
Sato, N
Shiraki, I
Petersen, CL
Boggild, P
Hansen, TM
Nagao, T
Grey, F
Citation: S. Hasegawa et al., Surface-state bands on silicon - Si(111)-root 3 x root 3-Ag surface superstructure, JPN J A P 1, 39(6B), 2000, pp. 3815-3822
Authors:
Stokbro, K
Quaade, UJ
Lin, R
Thirstrup, C
Grey, F
Citation: K. Stokbro et al., Electronic mechanism of STM-induced diffusion of hydrogen on Si(100), FARADAY DIS, (117), 2000, pp. 231-240
Authors:
Davis, ZJ
Abadal, G
Kuhn, O
Hansen, O
Grey, F
Boisen, A
Citation: Zj. Davis et al., Fabrication and characterization of nanoresonating devices for mass detection, J VAC SCI B, 18(2), 2000, pp. 612-616
Authors:
Boggild, P
Grey, F
Hassenkam, T
Greve, DR
Bjornholm, T
Citation: P. Boggild et al., Direct measurement of the microscale conductivity of conjugated polymer monolayers, ADVAN MATER, 12(13), 2000, pp. 947
Authors:
Shiraki, I
Nagao, T
Hasegawa, S
Petersen, CL
Boggild, P
Hansen, TH
Grey, F
Citation: I. Shiraki et al., Micro-four-point probes in a UHV scanning electron microscope for in-situ surface-conductivity measurements, SURF REV L, 7(5-6), 2000, pp. 533-537
Authors:
Boggild, P
Hansen, TM
Kuhn, O
Grey, F
Junno, T
Montelius, L
Citation: P. Boggild et al., Scanning nanoscale multiprobes for conductivity measurements, REV SCI INS, 71(7), 2000, pp. 2781-2783
Authors:
Petersen, CL
Grey, F
Shiraki, I
Hasegawa, S
Citation: Cl. Petersen et al., Microfour-point probe for studying electronic transport through surface states, APPL PHYS L, 77(23), 2000, pp. 3782-3784
Authors:
Weichel, S
Grey, F
Rasmussen, K
Nielsen, M
Feidenhans'l, R
Howes, PB
Vedde, J
Citation: S. Weichel et al., Fusion bonding of Si wafers investigated by x ray diffraction, APPL PHYS L, 76(1), 2000, pp. 70-72
The interface structure in directly bonded silicon crystals studied by synchrotron X-ray diffraction
Authors:
Nielsen, M
Feidenhans'l, R
Howes, PB
Vedde, J
Rasmussen, K
Benamara, M
Grey, F
Citation: M. Nielsen et al., The interface structure in directly bonded silicon crystals studied by synchrotron X-ray diffraction, SURF SCI, 442(1), 1999, pp. L989-L994
Authors:
Abadal, G
Boisen, A
Davis, ZJ
Hansen, O
Grey, F
Citation: G. Abadal et al., Combined laser and atomic force microscope lithography on aluminum: Mask fabrication for nanoelectromechanical systems, APPL PHYS L, 74(21), 1999, pp. 3206-3208
Authors:
Boisen, A
Birkelund, K
Hansen, O
Grey, F
Citation: A. Boisen et al., Fabrication of submicron suspended structures by laser and atomic force microscopy lithography on aluminum combined with reactive ion etching, J VAC SCI B, 16(6), 1998, pp. 2977-2981
Authors:
Hansen, O
Ravnkilde, JT
Quaade, U
Stokbro, K
Grey, F
Citation: O. Hansen et al., Field-induced deformation as a mechanism for scanning tunneling microscopybased nanofabrication, PHYS REV L, 81(25), 1998, pp. 5572-5575
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