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Results: 1-25/27
Authors:
Colin, J
Lesueur, D
Grilhe, J
Citation: J. Colin et al., Free-surface deformation of irradiated solids, PHIL MAG A, 81(4), 2001, pp. 857-866
Authors:
Cleymand, F
Coupeau, C
Grilhe, J
Citation: F. Cleymand et al., Experimental investigation of the instability of buckling patterns: From straight-sided to wormlike structures, SCR MATER, 44(11), 2001, pp. 2623-2627
Authors:
Colin, J
Grinfeld, M
Grilhe, J
Citation: J. Colin et al., Thermodynamic approach of surface instability under irradiation, ACT MATER, 49(18), 2001, pp. 3711-3718
Authors:
Brochard, S
Beauchamp, P
Grilhe, J
Citation: S. Brochard et al., Simulations of dislocation nucleation from atomic size surface steps and grooves, MAT SCI E A, 309, 2001, pp. 456-462
Authors:
Coupeau, C
Grilhe, J
Citation: C. Coupeau et J. Grilhe, Atomic force microscopy observations of in situ deformed materials: application to single crystals and thin films on substrates, J MICROSC O, 203, 2001, pp. 99-107
Authors:
Brochard, S
Beauchamp, P
Grilhe, J
Citation: S. Brochard et al., Dislocation nucleation from surface steps: atomistic simulation in aluminium, PHIL MAG A, 80(3), 2000, pp. 503-524
Authors:
Colin, J
Cleymand, F
Coupeau, C
Grilhe, J
Citation: J. Colin et al., Worm-like delamination patterns of thin stainless steel films on polycarbonate substrates, PHIL MAG A, 80(11), 2000, pp. 2559-2565
Authors:
Coupeau, C
Cleymand, F
Grilhe, J
Citation: C. Coupeau et al., Atomic force microscopy of dislocation locking effects at gold film LiF substrate interface, SCR MATER, 43(2), 2000, pp. 187-192
Authors:
Cleyman, F
Coupeau, C
Colin, J
Grilhe, J
Citation: F. Cleyman et al., Interactive study of straight-sided buckling patterns in thin films under compressive stress, EPJ-APPL PH, 10(1), 2000, pp. 3-7
Authors:
Cleymand, F
Coupeau, C
Colin, J
Grilhe, J
Citation: F. Cleymand et al., Mechanical behaviour of thin films on substrates: Debonding and buckling, J PHYS IV, 10(P6), 2000, pp. 47-52
Authors:
Colin, J
Grilhe, J
Citation: J. Colin et J. Grilhe, Island formation by stress induced diffusion on the surface of a very thinlayer epitaxially stressed on a substrate, J PHYS IV, 10(P6), 2000, pp. 65-69
Authors:
Brochard, S
Beauchamp, P
Grilhe, J
Citation: S. Brochard et al., Stress concentration near a surface step and shear localization, PHYS REV B, 61(13), 2000, pp. 8707-8713
Authors:
Boubeker, B
Talea, M
Goudeau, P
Coupeau, C
Grilhe, J
Citation: B. Boubeker et al., On the Young modulus of 304 L stainless steel thin films, MATER CHAR, 45(1), 2000, pp. 33-37
Authors:
Branger, V
Coupeau, C
Goudeau, P
Boubeker, B
Badawi, KF
Grilhe, J
Citation: V. Branger et al., Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates, J MAT SCI L, 19(4), 2000, pp. 353-355
Authors:
Coupeau, C
Grilhe, J
Oulevey, F
Kulik, A
Benoit, W
Citation: C. Coupeau et al., Role of dislocation structure on nanomechanical properties, J MAT SCI L, 19(3), 2000, pp. 259-262
Authors:
Coupeau, C
Brochard, S
Jouiad, M
Coujou, A
Grilhe, J
Citation: C. Coupeau et al., In-situ atomic force microscopy and transmission electron microscopy observations of the deformation of MC2 nickel-based superalloy gamma phase, PHIL MAG A, 79(3), 1999, pp. 627-638
Authors:
Coupeau, C
Bonneville, J
Matterstock, B
Grilhe, J
Marti, JL
Citation: C. Coupeau et al., Slip line analysis in Ni3Al by atomic force microscopy, SCR MATER, 41(9), 1999, pp. 945-950
Authors:
Colin, J
Thilly, L
Lecouturier, F
Peyrade, JP
Askenazy, S
Grilhe, J
Citation: J. Colin et al., Axial and radial interface instabilities of copper/tantalum cylindrical conductors, ACT MATER, 47(9), 1999, pp. 2761-2768
Authors:
Thilly, L
Colin, J
Lecouturier, F
Peyrade, JP
Grilhe, J
Askenazy, S
Citation: L. Thilly et al., Interface instability in the drawing process of copper/tantalum conductors, ACT MATER, 47(3), 1999, pp. 853-857
Authors:
Tromas, C
Colin, J
Coupeau, C
Girard, JC
Woirgard, J
Grilhe, J
Citation: C. Tromas et al., Pop-in phenomenon during nanoindentation in MgO, EPJ-APPL PH, 8(2), 1999, pp. 123-128
Authors:
Coupeau, C
Tranchant, F
Vergnol, J
Grilhe, J
Citation: C. Coupeau et al., Atomic force microscopy of twin formation in low-stacking fault CuAl alloy, EPJ-APPL PH, 6(1), 1999, pp. 1-6
Authors:
Coupeau, C
Grilhe, J
Citation: C. Coupeau et J. Grilhe, On the relation between Frank-Read source nature and fine slip line structure, EPJ-APPL PH, 5(3), 1999, pp. 231-236
Authors:
Coupeau, C
Colin, J
Grilhe, J
Citation: C. Coupeau et al., Nano-undulations of nickel thin films on a substrate under compressive stress, PHIL MAG L, 79(8), 1999, pp. 497-501
Authors:
Coupeau, C
Grilhe, J
Citation: C. Coupeau et J. Grilhe, Quantitative analysis of surface effects of plastic deformation, MAT SCI E A, 271(1-2), 1999, pp. 242-250
Authors:
Tucoulou, R
Brunel, M
Roshchupkin, DV
Schelokov, IA
Colin, J
Grilhe, J
Citation: R. Tucoulou et al., Electromigration in Al thin films induced by surface acoustic waves: Application to imaging, IEEE ULTRAS, 46(4), 1999, pp. 856-860