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Results:
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Results: 20
Authors:
Toth, AL
Dozsa, L
Gyulai, J
Giannazzo, F
Raineri, V
Citation: Al. Toth et al., SCTS: scanning capacitance transient spectroscopy, MAT SC S PR, 4(1-3), 2001, pp. 89-91
Authors:
Nagy, P
Szabo, B
Szabo, Z
Havancsak, K
Biro, LP
Gyulai, J
Citation: P. Nagy et al., A model for the hillock formation on graphite surfaces by 246 MeV Kr+ ions, ULTRAMICROS, 86(1-2), 2001, pp. 31-38
Authors:
Barabanenkov, MY
Gyulai, J
Leonov, AV
Mordkovich, VN
Omelyanovskaya, NM
Ryssel, H
Citation: My. Barabanenkov et al., The influence of target temperature and photon assistance on the radiationdefect formation in low-fluence ion-implanted silicon, NUCL INST B, 174(3), 2001, pp. 304-310
Authors:
Petrik, P
Lehnert, W
Schneider, C
Lohner, T
Fried, M
Gyulai, J
Ryssel, H
Citation: P. Petrik et al., In situ measurement of the crystallization of amorphous silicon in a vertical furnace using spectroscopic ellipsometry, THIN SOL FI, 383(1-2), 2001, pp. 235-240
Authors:
Raineri, V
Coffa, S
Szilagyi, E
Gyulai, J
Rimini, E
Citation: V. Raineri et al., He-vacancy interactions in Si and their influence on bubble formation and evolution, PHYS REV B, 61(2), 2000, pp. 937-945
Authors:
Nagy, P
Ehlich, R
Biro, LP
Gyulai, J
Citation: P. Nagy et al., Y-branching of single walled carbon nanotubes, APPL PHYS A, 70(4), 2000, pp. 481-483
Authors:
Lohner, T
Fried, M
Petrik, P
Polgar, O
Gyulai, J
Lehnert, W
Citation: T. Lohner et al., Ellipsometric characterization of oxidized porous silicon layer structures, MAT SCI E B, 69, 2000, pp. 182-187
Authors:
Khanh, NQ
Zolnai, Z
Lohner, T
Toth, L
Dobos, L
Gyulai, J
Citation: Nq. Khanh et al., He ion beam density effect on damage induced in SiC during Rutherford backscattering measurement, NUCL INST B, 161, 2000, pp. 424-428
Authors:
Mark, GI
Biro, LP
Gyulai, J
Thiry, PA
Lucas, AA
Lambin, P
Citation: Gi. Mark et al., Simulation of scanning tunneling spectroscopy of supported carbon nanotubes, PHYS REV B, 62(4), 2000, pp. 2797-2805
Authors:
Petrik, P
Lehnert, W
Schneider, C
Fried, M
Lohner, T
Gyulai, J
Ryssel, H
Citation: P. Petrik et al., In situ spectroscopic ellipsometry for the characterization of polysiliconformation inside a vertical furnace, THIN SOL FI, 364(1-2), 2000, pp. 150-155
Authors:
Petrik, P
Lohner, T
Fried, M
Biro, LP
Khanh, NQ
Gyulai, J
Lehnert, W
Schneider, C
Ryssel, H
Citation: P. Petrik et al., Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition, J APPL PHYS, 87(4), 2000, pp. 1734-1742
Authors:
Biro, LP
Molnar, G
Szabo, I
Vertesy, Z
Horvath, ZE
Gyulai, J
Konya, Z
Piedigrosso, P
Fonseca, A
Nagy, JB
Thiry, PA
Citation: Lp. Biro et al., Selective nucleation and growth of carbon nanotubes at the CoSi2/Si interface, APPL PHYS L, 76(6), 2000, pp. 706-708
Authors:
Biro, LP
Gyulai, J
Mark, GI
Daroczi, CS
Citation: Lp. Biro et al., Defects caused by high-energy ion beams, as measured by scanning probe methods, MICRON, 30(3), 1999, pp. 245-254
Authors:
Horvath, ZE
Peto, G
Paszti, Z
Zsoldos, E
Szilagyi, E
Battistig, G
Lohner, T
Molnar, GL
Gyulai, J
Citation: Ze. Horvath et al., Enhancement of oxidation resistance in Cu and Cu(Al) thin layers, NUCL INST B, 148(1-4), 1999, pp. 868-871
Authors:
Biro, LP
Szabo, B
Mark, GI
Gyulai, J
Havancsak, K
Kurti, J
Dunlop, A
Frey, L
Ryssel, H
Citation: Lp. Biro et al., Carbon nanotubes produced by high energy (E > 100 MeV), heavy ion irradiation of graphite, NUCL INST B, 148(1-4), 1999, pp. 1102-1105
Authors:
Petrik, P
Lohner, T
Fried, M
Khanh, NQ
Polgar, O
Gyulai, J
Citation: P. Petrik et al., Comparative study of ion implantation caused damage depth profiles in polycrystalline and single crystalline silicon studied by spectroscopic ellipsometry and Rutherford backscattering spectrometry, NUCL INST B, 147(1-4), 1999, pp. 84-89
Authors:
Khanh, NQ
Kovacsics, C
Mohacsy, T
Adam, M
Gyulai, J
Citation: Nq. Khanh et al., Measuring the generation lifetime profile modified by MeV H+ ion implantation in silicon, NUCL INST B, 147(1-4), 1999, pp. 111-115
Authors:
Biro, LP
Mark, GI
Gyulai, J
Havancsak, K
Lipp, S
Lehrer, C
Frey, L
Ryssel, H
Citation: Lp. Biro et al., AFM and STM investigation of carbon nanotubes produced by high energy ion irradiation of graphite, NUCL INST B, 147(1-4), 1999, pp. 142-147
Authors:
Biro, LP
Mark, GI
Gyulai, J
Rozlosnik, N
Kurti, J
Szabo, B
Frey, L
Ryssel, H
Citation: Lp. Biro et al., Scanning probe method investigation of carbon nanotubes produced by high energy ion irradiation of graphite, CARBON, 37(5), 1999, pp. 739-744
Authors:
Mark, GI
Biro, LP
Gyulai, J
Citation: Gi. Mark et al., Simulation of STM images of three-dimensional surfaces and comparison withexperimental data: Carbon nanotubes, PHYS REV B, 58(19), 1998, pp. 12645-12648
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