Authors:
PINDL S
BIEBL M
HAMMERL E
SCHAFER H
VONPHILIPSBORN H
Citation: S. Pindl et al., OXIDATION ENHANCED DIFFUSION OF BORON IN SILICON-ON-INSULATOR SUBSTRATES, Journal of the Electrochemical Society, 144(11), 1997, pp. 4022-4026
Authors:
BRITTON DT
WILLUTZKI P
TRIFTSHAUSER W
HAMMERL E
HANSCH W
EISELE I
Citation: Dt. Britton et al., ON THE SENSITIVITY OF POSITRONS TO ELECTRIC-FIELDS AND DEFECTS IN MBE-GROWN SILICON STRUCTURES, Applied physics. A, Solids and surfaces, 58(4), 1994, pp. 389-393