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Results:
1-17
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Results: 17
Authors:
MIKHAILOV S
SAVAN A
PFLUGER E
KNOBLAUCH L
HAUERT R
SIMMONDS M
VANSWYGENHOVEN H
Citation: S. Mikhailov et al., MORPHOLOGY AND TRIBOLOGICAL PROPERTIES OF METAL (OXIDE) MOS2 NANOSTRUCTURED MULTILAYER COATINGS, Surface & coatings technology, 105(1-2), 1998, pp. 175-183
Authors:
PLAPPERT EC
STUMM T
VANDENBERGH H
HAUERT R
DAHMEN KH
Citation: Ec. Plappert et al., GROWTH OF COPPER-FILMS BY METAL-ORGANIC VAPOR-DEPOSITION USING (PYRAZOLYLBORATE)COPPER(I) COMPOUNDS, CHEMICAL VAPOR DEPOSITION, 3(1), 1997, pp. 37-43
Authors:
HA SW
HAUERT R
ERNST KH
WINTERMANTEL E
Citation: Sw. Ha et al., SURFACE-ANALYSIS OF CHEMICALLY-ETCHED AND PLASMA-TREATED POLYETHERETHERKETONE (PEEK) FOR BIOMEDICAL APPLICATIONS, Surface & coatings technology, 96(2-3), 1997, pp. 293-299
Authors:
SIMMONDS MC
VANSWYGENHOVEN H
PFLUGER E
SAVAN A
HAUERT R
KNOBLAUCH L
MIKHAILOV S
Citation: Mc. Simmonds et al., MAGNETRON SPUTTER-DEPOSITION AND CHARACTERIZATION OF TI TIN, AU/TIN AND MOSX/PB MULTILAYERS/, Surface & coatings technology, 94-5(1-3), 1997, pp. 490-494
Authors:
KNOBLAUCH L
HAUERT R
SAVAN A
PFLUGER E
TIXIER S
SIMMONDS M
VANSWYGENHOVEN H
MIKHAILOV S
Citation: L. Knoblauch et al., TRIBOLOGICAL PROPERTIES OF BIAS VOLTAGE MODULATED A-C-H NANOSCALED MULTILAYERS, Surface & coatings technology, 94-5(1-3), 1997, pp. 521-524
Authors:
BUHLER J
STEINER FP
HAUERT R
BALTES H
Citation: J. Buhler et al., LINEAR-ARRAY OF COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR DOUBLE-PASS METAL MICROMIRRORS, Optical engineering, 36(5), 1997, pp. 1391-1398
Authors:
HAUERT R
MULLER U
FRANCZ G
BIRCHLER F
SCHROEDER A
MAYER J
WINTERMANTEL E
Citation: R. Hauert et al., SURFACE-ANALYSIS AND BIOREACTIONS OF F AND SI CONTAINING A-C-H, Thin solid films, 308, 1997, pp. 191-194
Authors:
MULLER U
HAUERT R
Citation: U. Muller et R. Hauert, XPS INVESTIGATION OF TI-O CONTAINING DIAMOND-LIKE CARBON-FILMS, Thin solid films, 291, 1996, pp. 323-327
Authors:
ORAL B
HAUERT R
MULLER U
ERNST KH
Citation: B. Oral et al., STRUCTURAL-CHANGES IN DOPED A-C-H FILMS DURING ANNEALING, DIAMOND AND RELATED MATERIALS, 4(4), 1995, pp. 482-487
Authors:
MULLER U
HAUERT R
ORAL B
TOBLER M
Citation: U. Muller et al., TEMPERATURE STABILITY OF FLUORINATED AMORPHOUS HYDROGENATED CARBON-FILMS, Surface & coatings technology, 76(1-3), 1995, pp. 367-371
Authors:
MULLER U
HAUERT R
ORAL B
TOBLER M
Citation: U. Muller et al., PORES IN HYDROGENATED AMORPHOUS-CARBON FILMS ON STAINLESS-STEEL, Surface & coatings technology, 71(3), 1995, pp. 233-238
Authors:
JANSSON C
TOUGAARD S
BEAMSON G
BRIGGS D
DAVIES SF
ROSSI A
HAUERT R
HOBI G
BROWN NMD
MEENAN BJ
ANDERSON CA
REPOUX M
MALITESTA C
SABBATINI L
Citation: C. Jansson et al., INTERCOMPARISON OF ALGORITHMS FOR BACKGROUND CORRECTION IN XPS, Surface and interface analysis, 23(7-8), 1995, pp. 484-494
Authors:
HAUERT R
GLISENTI A
METIN S
GOITIA J
KAUFMAN JH
VANLOOSDRECHT PHM
KELLOCK AJ
HOFFMANN P
WHITE RL
HERMSMEIER BD
Citation: R. Hauert et al., INFLUENCE OF NITROGEN DOPING ON DIFFERENT PROPERTIES OF A-C-H, Thin solid films, 268(1-2), 1995, pp. 22-29
Authors:
LANG FR
PLAPPERT EC
DAHMEN KH
HAUERT R
NEBIKER P
DOBELI M
Citation: Fr. Lang et al., INVESTIGATION OF THE FILM GROWTH OF A NEW TITANIUM PRECURSOR FOR MOCVD, Journal of non-crystalline solids, 187, 1995, pp. 430-434
Authors:
ERNST KH
GRMAN D
HAUERT R
HOLLANDER E
Citation: Kh. Ernst et al., FLUORINE-INDUCED CORROSION OF ALUMINUM MICROCHIP BOND PADS - AN XPS AND AES ANALYSIS, Surface and interface analysis, 21(10), 1994, pp. 691-696
Authors:
ERNST KH
PATSCHEIDER J
HAUERT R
TOBLER M
Citation: Kh. Ernst et al., XPS STUDY OF THE A-C-H AL2O3 INTERFACE, Surface and interface analysis, 21(1), 1994, pp. 32-37
Authors:
HAUERT R
PATSCHEIDER J
TOBLER M
ZEHRINGER R
Citation: R. Hauert et al., XPS INVESTIGATION OF THE A-CH AL INTERFACE, Surface science, 292(1-2), 1993, pp. 121-129
Risultati:
1-17
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