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Results:
1-7
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Results: 7
Authors:
HEYVAERT I
TEMST K
VANHAESENDONCK C
BRUYNSERAEDE Y
Citation: I. Heyvaert et al., COMPARATIVE-STUDY OF THE INTERFACE ROUGHNESS OF AG AU AND CU/AU MULTILAYERS WITH SCANNING-TUNNELING-MICROSCOPY AND X-RAY-DIFFRACTION/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1121-1125
Authors:
HEYVAERT I
KRIM J
VANHAESENDONCK C
BRUYNSERAEDE Y
Citation: I. Heyvaert et al., SURFACE-MORPHOLOGY AND KINETIC ROUGHENING OF AG ON AG(111) STUDIED WITH SCANNING-TUNNELING-MICROSCOPY, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 54(1), 1996, pp. 349-353
Authors:
MAHESWARAN B
WILLIAMS MG
ZHANG JZ
WANG SQ
BONETTO CA
HEYVAERT I
TESTELIN C
MARKIEWICZ RS
GIESSEN BC
Citation: B. Maheswaran et al., TERRACE GROWTH IN PARTIALLY MELT-REGROWN EUBA2CU3O7-DELTA HIGH-T-C SUPERCONDUCTORS, Journal of superconductivity, 9(1), 1996, pp. 135-141
Authors:
VINCKIER A
HEYVAERT I
DHOORE A
MCKITTRICK T
VANHAESENDONCK C
ENGELBORGHS Y
HELLEMANS L
Citation: A. Vinckier et al., IMMOBILIZING AND IMAGING MICROTUBULES BY ATOMIC-FORCE MICROSCOPY, Ultramicroscopy, 57(4), 1995, pp. 337-343
Authors:
WAGNER P
FREY U
HILLMER F
HADISH A
JAKOB G
ADRIAN H
STEINBORN T
RANNO L
ELSCHNER A
HEYVAERT I
BRUYNSERAEDE Y
Citation: P. Wagner et al., CHARACTERIZATION OF EPITAXIAL BI2SR2CACU2O8-FILMS(DELTA THIN), Journal of superconductivity, 7(1), 1994, pp. 217-219
Authors:
GAO ZX
HEYVAERT I
WUYTS B
OSQUIGUIL E
VANHAESENDONCK C
BRUYNSERAEDE Y
Citation: Zx. Gao et al., EVIDENCE FOR A BRICK WALL MICROSTRUCTURE IN EPITAXIAL YBA2CU3OX FILMS, Applied physics letters, 65(6), 1994, pp. 770-772
Authors:
WAGNER P
HILLMER F
FREY U
ADRIAN H
STEINBORN T
RANNO L
ELSCHNER A
HEYVAERT I
BRUYNSERAEDE Y
Citation: P. Wagner et al., PREPARATION AND STRUCTURAL CHARACTERIZATION OF THIN EPITAXIAL BI2SR2CACU2O8-K RANGE(DELTA FILMS WITH T(C) IN THE 90), Physica. C, Superconductivity, 215(1-2), 1993, pp. 123-131
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