Authors: FITTING HJ HINGST T SCHREIBER E GEIB E

Citation: Hj. Fitting et al., VACUUM EMISSION OF HOT AND BALLISTIC ELECTRONS FROM GAAS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 2087-2089

Authors: REGGIANI L FITTING HJ HINGST T KOHN J BEAUVIVRE S VARANI L

Citation: L. Reggiani et al., COLLISIONAL BROADENING EFFECT IN VACUUM EMISSION OF HOT-ELECTRONS FROM SIO2 - THE ROLE OF NONPOLAR OPTICAL PHONON-SCATTERING, Physica status solidi. b, Basic research, 194(2), 1996, pp. 667-671

Authors: FITTING HJ HINGST T FRANZ R SCHREIBER E

Citation: Hj. Fitting et al., ELECTRONIC TRAP MICROSCOPY - A NEW MODE FOR SCANNING ELECTRON-MICROSCOPY (SEM), Scanning microscopy, 8(2), 1994, pp. 165-174

Authors: HINGST T HUBNER M FRANZ R KUHR JC FITTING HJ

Citation: T. Hingst et al., HIGH-FIELD EBIC BY COMPUTER CONTROLLING, Microelectronic engineering, 24(1-4), 1994, pp. 181-188