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Results: 1-10 |
Results: 10
LASER DIFFRACTION SPECTROSCOPY - INFLUENCE OF PARTICLE-SHAPE AND A SHAPE ADAPTATION TECHNIQUE
Authors: MUHLENWEG H HIRLEMAN ED
Citation: H. Muhlenweg et Ed. Hirleman, LASER DIFFRACTION SPECTROSCOPY - INFLUENCE OF PARTICLE-SHAPE AND A SHAPE ADAPTATION TECHNIQUE, Particle & particle systems characterization, 15(4), 1998, pp. 163-169
EVALUATION OF ITERATION METHODS USED WHEN MODELING SCATTERING FROM FEATURES ON SURFACES USING THE DISCRETE-DIPOLE APPROXIMATION
Authors: NEBEKER BM STARR GW HIRLEMAN ED
Citation: Bm. Nebeker et al., EVALUATION OF ITERATION METHODS USED WHEN MODELING SCATTERING FROM FEATURES ON SURFACES USING THE DISCRETE-DIPOLE APPROXIMATION, Journal of quantitative spectroscopy & radiative transfer, 60(3), 1998, pp. 493-500
DISCRETE-DIPOLE APPROXIMATION FOR SCATTERING BY FEATURES ON SURFACES BY MEANS OF A 2-DIMENSIONAL FAST FOURIER-TRANSFORM TECHNIQUE
Authors: SCHMEHL R NEBEKER BM HIRLEMAN ED
Citation: R. Schmehl et al., DISCRETE-DIPOLE APPROXIMATION FOR SCATTERING BY FEATURES ON SURFACES BY MEANS OF A 2-DIMENSIONAL FAST FOURIER-TRANSFORM TECHNIQUE, Journal of the Optical Society of America. A, Optics, image science,and vision., 14(11), 1997, pp. 3026-3036
TOWARD CLASSIFICATION OF PARTICLE PROPERTIES USING LIGHT-SCATTERING TECHNIQUES
Authors: WARNER TL HIRLEMAN ED
Citation: Tl. Warner et Ed. Hirleman, TOWARD CLASSIFICATION OF PARTICLE PROPERTIES USING LIGHT-SCATTERING TECHNIQUES, Journal of the IES, 40(3), 1997, pp. 15-21
HISTORY OF DEVELOPMENT OF THE PHASE-DOPPLER PARTICLE-SIZING VELOCIMETER
Authors: HIRLEMAN ED
Citation: Ed. Hirleman, HISTORY OF DEVELOPMENT OF THE PHASE-DOPPLER PARTICLE-SIZING VELOCIMETER, Particle & particle systems characterization, 13(2), 1996, pp. 59-67
MODELING OF LIGHT-SCATTERING BY SUBMICROMETER SPHERICAL-PARTICLES ON SILICON AND OXIDIZED SILICON SURFACES
Authors: LISWITH ML BAWOLEK EJ HIRLEMAN ED
Citation: Ml. Liswith et al., MODELING OF LIGHT-SCATTERING BY SUBMICROMETER SPHERICAL-PARTICLES ON SILICON AND OXIDIZED SILICON SURFACES, Optical engineering, 35(3), 1996, pp. 858-869
FORWARD LIGHT-SCATTERING FOR ARBITRARY SHARP-EDGED CONVEX CRYSTALS INFRAUNHOFER AND ANOMALOUS DIFFRACTION APPROXIMATIONS
Authors: HEFFELS C HEITZMANN D HIRLEMAN ED SCARLETT B
Citation: C. Heffels et al., FORWARD LIGHT-SCATTERING FOR ARBITRARY SHARP-EDGED CONVEX CRYSTALS INFRAUNHOFER AND ANOMALOUS DIFFRACTION APPROXIMATIONS, Applied optics, 34(28), 1995, pp. 6552-6560
THE USE OF AZIMUTHAL INTENSITY VARIATIONS IN DIFFRACTION PATTERNS FORPARTICLE-SHAPE CHARACTERIZATION
Authors: HEFFELS CMG HEITZMANN D HIRLEMAN ED SCARLETT B
Citation: Cmg. Heffels et al., THE USE OF AZIMUTHAL INTENSITY VARIATIONS IN DIFFRACTION PATTERNS FORPARTICLE-SHAPE CHARACTERIZATION, Particle & particle systems characterization, 11(3), 1994, pp. 194-199
INFLUENCE OF INTERNAL REFRACTIVE-INDEX GRADIENTS ON SIZE MEASUREMENTSOF SPHERICALLY SYMMETRICAL PARTICLES BY PHASE DOPPLER ANEMOMETRY
Authors: SCHNEIDER M HIRLEMAN ED
Citation: M. Schneider et Ed. Hirleman, INFLUENCE OF INTERNAL REFRACTIVE-INDEX GRADIENTS ON SIZE MEASUREMENTSOF SPHERICALLY SYMMETRICAL PARTICLES BY PHASE DOPPLER ANEMOMETRY, Applied optics, 33(12), 1994, pp. 2379-2388
LIGHT SCATTER FROM POLYSILICON AND ALUMINUM SURFACES AND COMPARISON WITH SURFACE-ROUGHNESS STATISTICS BY ATOMIC-FORCE MICROSCOPY
Authors: BAWOLEK EJ MOHR JB HIRLEMAN ED MAJUMDAR A
Citation: Ej. Bawolek et al., LIGHT SCATTER FROM POLYSILICON AND ALUMINUM SURFACES AND COMPARISON WITH SURFACE-ROUGHNESS STATISTICS BY ATOMIC-FORCE MICROSCOPY, Applied optics, 32(19), 1993, pp. 3377-3400
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