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Results: 1-10 |
Results: 10
INCREMENTAL-GROWTH MODEL FOR THE DEPOSITION OF SPATIALLY MODULATED THIN-FILM NANOSTRUCTURES
Authors: HODGKINSON I WU QH MCPHUN A
Citation: I. Hodgkinson et al., INCREMENTAL-GROWTH MODEL FOR THE DEPOSITION OF SPATIALLY MODULATED THIN-FILM NANOSTRUCTURES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(5), 1998, pp. 2811-2816
ANISOTROPIC ANTIREFLECTION COATINGS - DESIGN AND FABRICATION
Authors: HODGKINSON I WU QH
Citation: I. Hodgkinson et Qh. Wu, ANISOTROPIC ANTIREFLECTION COATINGS - DESIGN AND FABRICATION, Optics letters, 23(19), 1998, pp. 1553-1555
IN-SITU MEASUREMENT OF PRINCIPAL REFRACTIVE-INDEXES OF THIN-FILMS BY 2-ANGLE ELLIPSOMETRY
Authors: HODGKINSON I HAZEL J WU QH
Citation: I. Hodgkinson et al., IN-SITU MEASUREMENT OF PRINCIPAL REFRACTIVE-INDEXES OF THIN-FILMS BY 2-ANGLE ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 368-372
EMPIRICAL EQUATIONS FOR THE PRINCIPAL REFRACTIVE-INDEXES AND COLUMN ANGLE OF OBLIQUELY DEPOSITED FILMS OF TANTALUM OXIDE, TITANIUM-OXIDE, AND ZIRCONIUM-OXIDE
Authors: HODGKINSON I WU QH HAZEL J
Citation: I. Hodgkinson et al., EMPIRICAL EQUATIONS FOR THE PRINCIPAL REFRACTIVE-INDEXES AND COLUMN ANGLE OF OBLIQUELY DEPOSITED FILMS OF TANTALUM OXIDE, TITANIUM-OXIDE, AND ZIRCONIUM-OXIDE, Applied optics, 37(13), 1998, pp. 2653-2659
ANISOTROPIC SCATTER PATTERNS AND ANOMALOUS BIREFRINGENCE OF OBLIQUELYDEPOSITED CERIUM OXIDE-FILMS
Authors: HODGKINSON I CLOUGHLEY S WU QH KASSAM S
Citation: I. Hodgkinson et al., ANISOTROPIC SCATTER PATTERNS AND ANOMALOUS BIREFRINGENCE OF OBLIQUELYDEPOSITED CERIUM OXIDE-FILMS, Applied optics, 35(28), 1996, pp. 5563-5568
MODAL CONTOURS FOR BIAXIAL THIN-FILM WAVE-GUIDES
Authors: HODGKINSON I KASSAM S HAZEL J CLOUGHLEY S WU QH
Citation: I. Hodgkinson et al., MODAL CONTOURS FOR BIAXIAL THIN-FILM WAVE-GUIDES, Applied optics, 35(28), 1996, pp. 5569-5572
TRANSMISSION-MODE PERPENDICULAR INCIDENCE ELLIPSOMETRY OF ANISOTROPICTHIN-FILMS
Authors: WU QH HODGKINSON I
Citation: Qh. Wu et I. Hodgkinson, TRANSMISSION-MODE PERPENDICULAR INCIDENCE ELLIPSOMETRY OF ANISOTROPICTHIN-FILMS, Journal of optics, 25(2), 1994, pp. 43-49
EFFECTIVE PRINCIPAL REFRACTIVE-INDEXES AND COLUMN ANGLES FOR PERIODICSTACKS OF THIN BIREFRINGENT FILMS
Authors: HODGKINSON I WU QH
Citation: I. Hodgkinson et Qh. Wu, EFFECTIVE PRINCIPAL REFRACTIVE-INDEXES AND COLUMN ANGLES FOR PERIODICSTACKS OF THIN BIREFRINGENT FILMS, Journal of the Optical Society of America. A: Optics and image science, 10(9), 1993, pp. 2065-2071
PRECISION OF BREWSTER-ANGLE METHODS FOR OPTICAL THIN-FILMS
Authors: WU QH HODGKINSON I
Citation: Qh. Wu et I. Hodgkinson, PRECISION OF BREWSTER-ANGLE METHODS FOR OPTICAL THIN-FILMS, Journal of the Optical Society of America. A: Optics and image science, 10(9), 1993, pp. 2072-2075
ANISOTROPY IN THIN-FILMS - MODELING AND MEASUREMENT OF GUIDED AND NONGUIDED OPTICAL-PROPERTIES - APPLICATION TO TIO2 FILMS
Authors: FLORY F ENDELEMA D PELLETIER E HODGKINSON I
Citation: F. Flory et al., ANISOTROPY IN THIN-FILMS - MODELING AND MEASUREMENT OF GUIDED AND NONGUIDED OPTICAL-PROPERTIES - APPLICATION TO TIO2 FILMS, Applied optics, 32(28), 1993, pp. 5649-5659
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