Authors:
BERTON R
HUMMELGEN IA
GRUBER J
LI RWC
DESA EL
PERES LO
Citation: R. Berton et al., DETERMINATION OF THE ELECTROAFFINITY AND POTENTIAL BARRIER HEIGHTS ATPOLYMER METAL INTERFACES OF POLY(4,7-BENZOTHIOPHENE VINYLENE) (PBTV)/, Advanced materials for optics and electronics, 8(4), 1998, pp. 181-186
Authors:
DELIMA JR
SCHREINER C
HUMMELGEN IA
FORNARI CCM
FERREIRA CA
NART FC
Citation: Jr. Delima et al., CHARGE INJECTION FROM POLYANILINE-POLY (METHYLMETHACRYLATE) BLENDS INTO POLY (P-PHENYLENE VINYLENE), Journal of applied physics, 84(3), 1998, pp. 1445-1448
Authors:
NART FC
PERES LO
DESA EL
ROMAN LS
HUMMELGEN IA
GRUBER J
LI RWC
Citation: Fc. Nart et al., ELECTRONIC-PROPERTIES OF POLY(1,4-PHENYLENE METHYLIDYNENITRILO-1,4-PHENYLENE NITRILOMETHYLIDYNE) (PPI), Synthetic metals, 90(2), 1997, pp. 147-151
Authors:
YADAVA YP
DENICOLO G
ARIAS AC
ROMAN LS
HUMMELGEN IA
Citation: Yp. Yadava et al., PREPARATION AND CHARACTERIZATION OF TRANSPARENT CONDUCTING TIN OXIDE THIN-FILM ELECTRODES BY CHEMICAL-VAPOR-DEPOSITION FROM REACTIVE THERMAL EVAPORATION OF SNCL2, Materials chemistry and physics, 48(3), 1997, pp. 263-267
Citation: M. Koehler et Ia. Hummelgen, TEMPERATURE-DEPENDENT TUNNELING CURRENT AT METAL POLYMER INTERFACES -POTENTIAL BARRIER HEIGHT DETERMINATION/, Applied physics letters, 70(24), 1997, pp. 3254-3256
Authors:
ROMAN LS
YADAVA YP
DENICOLO G
ARIAS AC
HUMMELGEN IA
Citation: Ls. Roman et al., TIME-DEPENDENT STRUCTURAL MODIFICATIONS IN TIN OXIDE THIN-FILMS UNDERENVIRONMENTAL-CONDITIONS, Journal of materials science. Materials in electronics, 7(6), 1996, pp. 423-426
Citation: Ls. Roman et al., THE UNSTABLE BEHAVIOR OF AG PPV CHARGE INJECTION CONTACTS/, Journal of materials science letters, 15(15), 1996, pp. 1307-1309
Authors:
HUMMELGEN IA
YADAVA YP
ROMAN LS
ARIAS AC
FERNANDES MR
NART FC
Citation: Ia. Hummelgen et al., TIN OXIDE AS A TRANSPARENT ELECTRODE MATERIAL FOR LIGHT-EMITTING-DIODES FABRICATED WITH POLY (P-PHENYLENE VINYLENE), Bulletin of Materials Science, 19(2), 1996, pp. 423-427
Authors:
KOEHLER M
FERRARI EF
BARBOT JF
HUMMELGEN IA
Citation: M. Koehler et al., MODEL AND RESULTS FOR A DEEP-LEVEL WITH 2 DIFFERENT CONFIGURATIONS INHG0.3CD0.7TE, Physical review. B, Condensed matter, 53(12), 1996, pp. 7805-7809
Authors:
ROMAN LS
HUMMELGEN IA
NART FC
PERES LO
DESA EL
Citation: Ls. Roman et al., DETERMINATION OF ELECTROAFFINITY AND IONIZATION-POTENTIAL OF CONJUGATED POLYMERS VIA FOWLER-NORDHEIM TUNNELING MEASUREMENTS - THEORETICAL FORMULATION AND APPLICATION TO POLY(P-PHENYLENE VINYLENE), The Journal of chemical physics, 105(23), 1996, pp. 10614-10620
Authors:
HUMMELGEN IA
ROMAN LS
NART FC
PERES LO
SA EL
Citation: Ia. Hummelgen et al., POLYMER AND POLYMER METAL INTERFACE CHARACTERIZATION VIA FOWLER-NORDHEIM TUNNELING MEASUREMENTS/, Applied physics letters, 68(22), 1996, pp. 3194-3196
Authors:
BARBOT JF
GIRAULT P
BLANCHARD C
HUMMELGEN IA
Citation: Jf. Barbot et al., OBSERVATION OF DEEP LEVELS ASSOCIATED WITH DISLOCATIONS IN N-TYPE HG0.3CD0.7TE, Journal of Materials Science, 30(13), 1995, pp. 3471-3474
Citation: C. Wisniewski et al., ELECTROCHEMICALLY DEPOSITED COBALT THIN-FILMS ON P-TYPE SILICON AND ITS CHARACTERIZATION, Journal of the Electrochemical Society, 142(11), 1995, pp. 3889-3892
Citation: Ia. Hummelgen, A SIMPLE METHOD TO IDENTIFY ALPHA-DISLOCATIONS AND BETA-DISLOCATIONS PRODUCED BY HARDNESS INDENTATION ON (001) CDTE, Indian Journal of Pure & Applied Physics, 32(2), 1994, pp. 198-199