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Results:
1-14
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Results: 14
Authors:
CROKE ET
VAJO JJ
HUNTER AT
AHN CC
CHANDRASEKHAR D
LAURSEN T
SMITH DJ
MAYER JW
Citation: Et. Croke et al., STABILIZING THE SURFACE-MORPHOLOGY OF SI1-X-YGEXCY SI HETEROSTRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY THROUGH THE USE OF A SILICON-CARBIDESOURCE/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 1937-1942
Authors:
STEIN BL
YU ET
CROKE ET
HUNTER AT
LAURSEN T
MAYER JW
AHN CC
Citation: Bl. Stein et al., ELECTRONIC-PROPERTIES OF SI SI1-X-YGEXCY HETEROJUNCTIONS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1639-1643
Authors:
SCHAFFER CP
CHEN IC
STURDIVANT RL
HUNTER AT
WILSON RG
Citation: Cp. Schaffer et al., COMMERCIAL CVD DIAMOND FILMS - MATERIAL PROPERTIES AND THEIR RELATED EFFECTS ON MICROWAVE CHARACTERISTICS, DIAMOND AND RELATED MATERIALS, 7(2-5), 1998, pp. 585-588
Authors:
YOUNG MH
CHOW DH
HUNTER AT
MILES RH
Citation: Mh. Young et al., RECENT ADVANCES IN GA1-XINXSB INAS SUPERLATTICE IR DETECTOR MATERIALS/, Applied surface science, 123, 1998, pp. 395-399
Authors:
STEIN BL
YU ET
CROKE ET
HUNTER AT
LAURSEN T
MAYER JW
AHN CC
Citation: Bl. Stein et al., DEEP-LEVEL TRANSIENT SPECTROSCOPY OF SI SI1-X-YGEXCY HETEROSTRUCTURES/, Applied physics letters, 73(5), 1998, pp. 647-649
Authors:
STEIN BL
YU ET
CROKE ET
HUNTER AT
LAURSEN T
BAIR AE
MAYER JW
AHN CC
Citation: Bl. Stein et al., MEASUREMENT OF BAND OFFSETS IN SI SI1-XGEX AND SI/SI1-X-YGEXCY HETEROJUNCTIONS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1108-1111
Authors:
LAURSEN T
CHANDRASEKHAR D
SMITH DJ
MAYER JW
CROKE ET
HUNTER AT
Citation: T. Laursen et al., MATERIALS CHARACTERIZATION OF SI1-X-YGEXCY SI SUPERLATTICE STRUCTURES/, Thin solid films, 308, 1997, pp. 358-362
Authors:
CROKE ET
HUNTER AT
PETTERSSON PO
AHN CC
MCGILL TC
Citation: Et. Croke et al., IMPROVED GROWTH-MORPHOLOGY OF SI-GE-C HETEROSTRUCTURES THROUGH THE USE OF SB SURFACTANT-ASSISTED MOLECULAR-BEAM EPITAXY, Thin solid films, 294(1-2), 1997, pp. 105-111
Authors:
CROKE ET
HUNTER AT
AHN CC
LAURSEN T
CHANDRASEKHAR D
BAIR AE
SMITH DJ
MAYER JW
Citation: Et. Croke et al., CONTROL OF COMPOSITION AND CRYSTALLINITY IN THE MOLECULAR-BEAM EPITAXY OF STRAIN-COMPENSATED SI1-X-YGEXCY ALLOYS ON SI, Journal of crystal growth, 175, 1997, pp. 486-492
Authors:
STEIN BL
YU ET
CROKE ET
HUNTER AT
LAURSEN T
BAIR AE
MAYER JW
AHN CC
Citation: Bl. Stein et al., BAND OFFSETS IN SI SI1-X-YGEXCY HETEROJUNCTIONS MEASURED BY ADMITTANCE SPECTROSCOPY/, Applied physics letters, 70(25), 1997, pp. 3413-3415
Authors:
PETTERSSON PO
AHN CC
MCGILL TC
CROKE ET
HUNTER AT
Citation: Po. Pettersson et al., CHARACTERIZATION OF SI SI1-YCY SUPERLATTICES GROWN BY SURFACTANT ASSISTED MOLECULAR-BEAM EPITAXY/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 3030-3034
Authors:
PETTERSSON PO
AHN CC
MCGILL TC
CROKE ET
HUNTER AT
Citation: Po. Pettersson et al., SB-SURFACTANT-MEDIATED GROWTH OF SI SI1-YCY SUPERLATTICES BY MOLECULAR-BEAM EPITAXY/, Applied physics letters, 67(17), 1995, pp. 2530-2532
Authors:
LIU GY
GOODALL DM
HUNTER AT
MASSEY PR
Citation: Gy. Liu et al., PREPARATION OF MILLIGRAMS OF PURE ENANTIOMERS USING ANALYTICAL-SCALE HIGH-PERFORMANCE LIQUID-CHROMATOGRAPHY, Chirality, 6(4), 1994, pp. 290-294
Authors:
SWENBERG JF
WANG MW
MILES RJ
PHILLIPS MC
HUNTER AT
MCCALDIN JO
MCGILL TC
Citation: Jf. Swenberg et al., ADVANCES IN THE DEVELOPMENT OF GRADED INJECTOR VISIBLE-LIGHT EMITTERS, Journal of crystal growth, 138(1-4), 1994, pp. 692-696
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1-14
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