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Results: 1-11 |
Results: 11
Towards sub-10 nm carrier profiling with spreading resistance techniques
Authors: Clarysse, T Eyben, P Hantschel, T Vandervorst, W
Citation: T. Clarysse et al., Towards sub-10 nm carrier profiling with spreading resistance techniques, MAT SC S PR, 4(1-3), 2001, pp. 61-66
Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes
Authors: Hantschel, T Slesazeck, S Niedermann, P Eyben, P Vandervorst, W
Citation: T. Hantschel et al., Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes, MICROEL ENG, 57-8, 2001, pp. 749-754
Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy
Authors: De Wolf, P Stephenson, R Trenkler, T Clarysse, T Hantschel, T Vandevorst, W
Citation: P. De Wolf et al., Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy, J VAC SCI B, 18(1), 2000, pp. 361-368
Evaluating probes for "electrical" atomic force microscopy
Authors: Trenkler, T Hantschel, T Stephenson, R De Wolf, P Vandervorst, W Hellemans, L Malave, A Buchel, D Oesterschulze, E Kulisch, W Niedermann, P Sulzbach, T Ohlsson, O
Citation: T. Trenkler et al., Evaluating probes for "electrical" atomic force microscopy, J VAC SCI B, 18(1), 2000, pp. 418-427
Practicalities and limitations of scanning capacitance microscopy for routine integrated circuit characterization
Authors: Stephenson, R De Wolf, P Trenkler, T Hantschel, T Clarysse, T Jansen, P Vandervorst, W
Citation: R. Stephenson et al., Practicalities and limitations of scanning capacitance microscopy for routine integrated circuit characterization, J VAC SCI B, 18(1), 2000, pp. 555-559
Aspects of petroleum migration modelling
Authors: Welte, DH Hantschel, T Wygrala, BP Weissenburger, KS Carruthers, D
Citation: Dh. Welte et al., Aspects of petroleum migration modelling, J GEOCHEM E, 69, 2000, pp. 711-714
Finite element analysis and ray tracing modeling of petroleum migration
Authors: Hantschel, T Kauerauf, AI Wygrala, B
Citation: T. Hantschel et al., Finite element analysis and ray tracing modeling of petroleum migration, MAR PETR G, 17(7), 2000, pp. 815-820
Highly conductive diamond probes for scanning spreading resistance microscopy
Authors: Hantschel, T Niedermann, P Trenkler, T Vandervorst, W
Citation: T. Hantschel et al., Highly conductive diamond probes for scanning spreading resistance microscopy, APPL PHYS L, 76(12), 2000, pp. 1603-1605
Diamond tips and cantilevers for the characterization of semiconductor devices
Authors: Malave, A Oesterschulze, E Kulisch, W Trenkler, T Hantschel, T Vandervorst, W
Citation: A. Malave et al., Diamond tips and cantilevers for the characterization of semiconductor devices, DIAM RELAT, 8(2-5), 1999, pp. 283-287
Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy.
Authors: De Wolf, P Geva, M Reynolds, CL Hantschel, T Vandervorst, W Bylsma, RB
Citation: P. De Wolf et al., Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy., J VAC SCI A, 17(4), 1999, pp. 1285-1288
Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices
Authors: Hantschel, T Trenkler, T Vandervorst, W Malave, A Buchel, D Kulisch, W Oesterschulze, E
Citation: T. Hantschel et al., Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices, MICROEL ENG, 46(1-4), 1999, pp. 113-116
Risultati: 1-11 |