Citation: G. Harsanyi et G. Inzelt, Comparing migratory resistive short formation abilities of conductor systems applied in advanced interconnection systems, MICROEL REL, 41(2), 2001, pp. 229-237
Citation: G. Harsanyi, Processing induced material interactions determining the reliability of LTCC multichip modules, MICROEL REL, 40(2), 2000, pp. 339-345
Citation: G. Harsanyi, Copper may destroy chip-level reliability: Handle with care - Mechanism and conditions for copper migrated resistive short formation, IEEE ELEC D, 20(1), 1999, pp. 5-8
Citation: G. Harsanyi, Irregular effect of chloride impurities on migration failure reliability: contradictions or understandable?, MICROEL REL, 39(9), 1999, pp. 1407-1411
Citation: R. Dobay et al., Detection of uric acid with a new type of conducting polymer-based enzymatic sensor by bipotentiostatic technique, ANALYT CHIM, 385(1-3), 1999, pp. 187-194