Authors: Keshavarzi, A Roy, K Hawkins, CF

Citation: A. Keshavarzi et al., Intrinsic leakage in deep submicron CMOS ICs - Measurement-based test solutions, IEEE VLSI, 8(6), 2000, pp. 717-723

Authors: Hawkins, CF Soden, JM

Citation: Cf. Hawkins et Jm. Soden, Deep submicron CMOS current IC testing: Is there a future?, IEEE DES T, 16(4), 1999, pp. 14-15

Authors: Hawkins, CF Segura, J Soden, J Dellin, T

Citation: Cf. Hawkins et al., Test and reliability: Partners in IC manufacturing, part 2, IEEE DES T, 16(4), 1999, pp. 66-73

Authors: Hawkins, CF Segura, J

Citation: Cf. Hawkins et J. Segura, Test and reliability: Partners in IC manufacturing, part 1, IEEE DES T, 16(3), 1999, pp. 64-71

Authors: Hawkins, CF Baker, K Butler, K Figueras, J Nicolaidis, M Rao, V Roy, R Welsher, T

Citation: Cf. Hawkins et al., Roundtable: IC reliability and test: What will deep submicron bring?, IEEE DES T, 16(2), 1999, pp. 84-91

Authors: Segura, J De Paul, I Roca, M Isern, E Hawkins, CF

Citation: J. Segura et al., Experimental analysis of transient current testing based on charge observation, ELECTR LETT, 35(6), 1999, pp. 441-443