Authors:
Andres, E
Askebjer, P
Bai, X
Barouch, G
Barwick, SW
Bay, RC
Becker, KH
Bergstrom, L
Bertrand, D
Biron, A
Booth, J
Botner, O
Bouchta, A
Boyce, MM
Carius, S
Chirkin, D
Conrad, J
Costa, CGS
Cowen, DF
Dailing, J
Dalberg, E
DeYoung, T
Desiati, P
Dewulf, JP
Doksus, P
Edsjo, J
Ekstrom, P
Erlandsson, B
Feser, T
Gaug, M
Goldschmidt, A
Goobar, B
Haase, H
Hallgren, A
Halzen, F
Hanson, K
Hardtke, R
He, YD
Hellwig, M
Heukenkamp, H
Hill, GC
Hulth, PO
Hundertmark, S
Jacobsen, J
Karle, A
Kim, J
Koci, B
Kopke, L
Kowalski, M
Leich, H
Leuthold, M
Lindahl, P
Liubarsky, I
Loaiza, P
Lowder, DM
Ludvig, J
Madsen, J
Marciniewski, P
Matis, H
Mikolajski, T
Miller, TC
Minaeva, Y
Miocinovic, P
Mock, P
Morse, R
Neunhoffer, T
Newcomer, FM
Niessen, P
Nygren, DR
de los Heros, CP
Porrata, R
Price, PB
Rawlins, K
Reed, C
Rhode, W
Richards, A
Richter, S
Martino, JR
Romenesko, P
Ross, D
Rubinstein, H
Sander, HG
Scheider, T
Schmidt, T
Schneider, D
Schneider, E
Schwarz, R
Silvestri, A
Solarz, M
Spiczak, G
Spiering, C
Starinski, N
Steele, D
Steffen, P
Stokstad, RG
Streicher, O
Sun, Q
Taboada, I
Thollander, L
Thon, T
Tilav, S
Vander Donckt, M
Walck, C
Weinheimer, C
Wiebusch, CH
Wischnewski, R
Woschnagg, K
Wu, W
Yodh, G
Young, S
Citation: E. Andres et al., Results from the AMANDA high energy neutrino detector, NUCL PH B-P, 91, 2001, pp. 423-430
Authors:
Andres, E
Askebjer, P
Bai, X
Barouch, G
Barwick, SW
Bay, TC
Becker, KH
Bergstrom, L
Bertrand, D
Bierenbaum, D
Biron, A
Booth, J
Botner, O
Bouchta, A
Boyce, MM
Carius, S
Chen, A
Chirkin, D
Conrad, J
Cooley, J
Costa, CGS
Cowen, DF
Dailing, J
Dalberg, E
DeYoung, T
Desiati, P
Dewulf, JP
Doksus, P
Edsjo, J
Ekstrom, P
Erlandsson, B
Feser, T
Gaug, M
Goldschmidt, A
Goobar, A
Gray, L
Haase, H
Hallgren, A
Halzen, F
Hanson, K
Hardtke, R
He, YD
Hellwig, M
Heukenkamp, H
Hill, GC
Hulth, PO
Hundertmark, S
Jacobsen, J
Kandhadai, V
Karle, A
Kim, J
Koci, B
Kopke, L
Kowalski, M
Leich, H
Leuthold, M
Lindal, P
Liubarsky, I
Loaiza, P
Lowder, DM
Ludvig, J
Madsen, J
Marciniewski, P
Matis, HS
Mihalyi, A
Mikolajski, T
Miller, TC
Minaeva, Y
Miocinovic, P
Mock, PC
Morse, R
Neunhoffer, T
Newcomer, FM
Niessen, P
Nygren, DR
Ogelman, H
de los Heros, CP
Porrata, R
Price, PB
Rawlins, K
Reed, C
Rhode, W
Richards, A
Richter, S
Martino, JR
Romenesko, P
Ross, D
Rubinstein, H
Sander, HG
Scheider, T
Schmidt, T
Schneider, D
Schneider, E
Schwarz, R
Silvestri, A
Solarz, M
Spiczak, GM
Spiering, C
Starinsky, N
Steele, D
Steffen, P
Stokstad, RG
Usechak, N
Vander Donckt, M
Walck, C
Weinheimer, C
Wiebusch, CH
Wischnewski, R
Wissing, H
Woschnagg, K
Wu, W
Yodh, G
Young, S
Citation: E. Andres et al., Observation of high-energy neutrinos using Cerenkov detectors embedded deep in Antarctic ice, NATURE, 410(6827), 2001, pp. 441-443
Authors:
Shoemaker, DD
Schadt, EE
Armour, CD
He, YD
Garrett-Engele, P
McDonagh, PD
Loerch, PM
Leonardson, A
Lum, PY
Cavet, G
Wu, LF
Altschuler, SJ
Edwards, S
King, J
Tsang, JS
Schimmack, G
Schelter, JM
Koch, J
Ziman, M
Marton, MJ
Li, B
Cundiff, P
Ward, T
Castle, J
Krolewski, M
Meyer, MR
Mao, M
Burchard, J
Kidd, MJ
Dai, H
Phillips, JW
Linsley, PS
Stoughton, R
Scherer, S
Boguski, MS
Citation: Dd. Shoemaker et al., Experimental annotation of the human genome using microarray technology, NATURE, 409(6822), 2001, pp. 922
Authors:
Guan, H
Cho, BJ
Li, MF
Xu, Z
He, YD
Dong, Z
Citation: H. Guan et al., Experimental evidence of interface-controlled mechanism of quasi-breakdownin ultrathin gate oxide, IEEE DEVICE, 48(5), 2001, pp. 1010-1013
Citation: Ch. Xu et al., High temperature oxidation behaviour of FeAl intermetallics - Oxide scalesformed in ambient atmosphere, SCR MATER, 42(10), 2000, pp. 975-980
Citation: Hm. Pang et al., High-frequency electropulse deposition of microcrystallized MGH754 ODS alloy coatings, SCI CHINA B, 43(5), 2000, pp. 540-546
Authors:
Yu, WP
He, YD
Zhang, LN
Wang, DR
Yuan, XW
Gao, W
Citation: Wp. Yu et al., Oxidation resistant coatings of ZrO2 and ZrO2-Y2O3 applied by high energy pulse plasma deposition, HIGH TEMP M, 19(6), 2000, pp. 435-442
Citation: Zw. Li et al., An ultralow oxygen partial pressure-controlling system and its applicationto oxidation studies, OXID METAL, 54(1-2), 2000, pp. 47-62
Citation: B. Xie et al., A new method of studying on the dynamic parameters of bulk traps in thin SiO2 layer of MOS structures, MICROEL REL, 40(6), 2000, pp. 1039-1043
Citation: H. Guan et al., A thorough study of quasi-breakdown phenomenon of thin gate oxide in dual-gate CMOSFET's, IEEE DEVICE, 47(8), 2000, pp. 1608-1616