Authors:
Holscher, H
Gotsmann, B
Allers, W
Schwarz, UD
Fuchs, H
Wiesendanger, R
Citation: H. Holscher et al., Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique - art. no. 075402, PHYS REV B, 6407(7), 2001, pp. 5402
Citation: Ud. Schwarz et al., Atomic resolution in scanning force microscopy: Concepts, requirements, contrast mechanisms, and image interpretation, PHYS REV B, 62(19), 2000, pp. 13089-13097
Authors:
Holscher, H
Allers, W
Schwarz, UD
Schwarz, A
Wiesendanger, R
Citation: H. Holscher et al., Interpretation of "true atomic resolution" images of graphite (0001) in noncontact atomic force microscopy, PHYS REV B, 62(11), 2000, pp. 6967-6970
Authors:
Holscher, H
Schwarz, A
Allers, W
Schwarz, UD
Wiesendanger, R
Citation: H. Holscher et al., Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001)in the contact and noncontact regimes, PHYS REV B, 61(19), 2000, pp. 12678-12681
Authors:
Holscher, H
Raberg, W
Schwarz, UD
Hasbach, A
Wandelt, K
Wiesendanger, R
Citation: H. Holscher et al., Imaging of sub-unit-cell structures in the contact mode of the scanning force microscope, PHYS REV B, 59(3), 1999, pp. 1661-1664
Authors:
Holscher, H
Allers, W
Schwarz, UD
Schwarz, A
Wiesendanger, R
Citation: H. Holscher et al., Determination of tip-sample interaction potentials by dynamic force spectroscopy, PHYS REV L, 83(23), 1999, pp. 4780-4783