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Results: 1-12 |
Results: 12

Authors: Kira, M Hoyer, W Stroucken, T Koch, SW
Citation: M. Kira et al., Exciton formation in semiconductors and the influence of a photonic environment - art. no. 176401, PHYS REV L, 8717(17), 2001, pp. 6401

Authors: Halm, T Nzali, JN Hoyer, W May, RP Bionducci, A
Citation: T. Halm et al., Short-range and medium-range order in molten Ga-Tl alloys, J NON-CRYST, 293, 2001, pp. 182-186

Authors: Kaban, I Halm, T Hoyer, W
Citation: I. Kaban et al., Structure of molten copper-germanium alloys, J NON-CRYST, 288(1-3), 2001, pp. 96-102

Authors: Nzali, JN Hoyer, W
Citation: Jn. Nzali et W. Hoyer, X-ray investigations of liquid bismuth-copper alloys, Z NATURFO A, 55(3-4), 2000, pp. 381-389

Authors: Jahnke, F Kira, M Hoyer, W Koch, SW
Citation: F. Jahnke et al., Influence of correlation effects on the excitonic semiconductor photoluminescence, PHYS ST S-B, 221(1), 2000, pp. 189-193

Authors: Kira, M Hoyer, W Jahnke, F Koch, SW
Citation: M. Kira et al., Exciton population effects in semiconductor luminescence, PHYS ST S-B, 221(1), 2000, pp. 301-305

Authors: Collard, S Kupfer, H Hecht, G Hoyer, W Moussaoui, H
Citation: S. Collard et al., The reactive magnetron deposition of CrNxOy films: first results of property investigations, SURF COAT, 112(1-3), 1999, pp. 181-184

Authors: Merkwitz, M Hoyer, W
Citation: M. Merkwitz et W. Hoyer, Liquid-liquid interfacial tension in the demixing metal systems Al-Pb and Al-In, Z METALLKUN, 90(5), 1999, pp. 363-370

Authors: Collard, S Kupfer, H Hoyer, W Hecht, G
Citation: S. Collard et al., Growth of nitrogen stabilised cubic ZrO2 phase by reactive magnetron sputtering using two reactive gases, VACUUM, 55(2), 1999, pp. 153-157

Authors: Alteholz, T Hoyer, W
Citation: T. Alteholz et W. Hoyer, X-ray diffraction experiments on Ag and Ge in normal and supercooled liquid phase, J NON-CRYST, 250, 1999, pp. 48-52

Authors: Halm, T Nzali, JN Hoyer, W May, RP
Citation: T. Halm et al., Neutron small-angle scattering on molten Ga-Tl alloys, J NON-CRYST, 250, 1999, pp. 293-296

Authors: Collard, S Hoyer, W
Citation: S. Collard et W. Hoyer, Precautions to follow in X-ray diffraction analysis of carbon nitride films on Si(100), J PHYS IV, 8(P5), 1998, pp. 241-247
Risultati: 1-12 |