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Results: 1-25/43
Authors:
Pollak, C
Stubbings, T
Hutter, H
Citation: C. Pollak et al., Differential image distortion correction, MICROS MICR, 7(4), 2001, pp. 335-340
Authors:
Gritsch, M
Piplits, K
Barbist, R
Wilhartitz, P
Hutter, H
Citation: M. Gritsch et al., SIMS analysis of the oxidation behaviour of SiFeCr coated technical refractory metal alloys, MATER CORRO, 52(7), 2001, pp. 501-508
Authors:
Pollak, C
Hutter, H
Warbichler, P
Reichmann, K
Citation: C. Pollak et al., Clarification by TEM and SIMS of abnormal Ti depth distribution in chemical solution-deposited SrTiO3/La0.5Sr0.5CoO3, FRESEN J AN, 371(1), 2001, pp. 54-57
Authors:
Rosner, M
Eisenmenger-Sittner, C
Hutter, H
Citation: M. Rosner et al., Investigations on codeposited aluminum-tin systems with SIMS, J TR MICROP, 19(1), 2001, pp. 91-98
Authors:
Blaschitz, A
Hutter, H
Leitner, V
Pilz, S
Wintersteiger, R
Dohr, G
Sedlmayer, P
Citation: A. Blaschitz et al., Reaction patterns of monoclonal antibodies to HLA-G in human tissues and on cell lines: a comparative study. (vol 61, pg 1074, 2000), HUMAN IMMUN, 62(3), 2001, pp. 297-297
Authors:
Pollak, C
Reichmann, K
Hutter, H
Citation: C. Pollak et al., SIMS investigation of chemical solution-deposited SrTiO3/LaNiO3, APPL SURF S, 179(1-4), 2001, pp. 133-137
Authors:
Hutter, H
Nowikow, K
Gammer, K
Citation: H. Hutter et al., Visualization of 3D-SIMS measurements, APPL SURF S, 179(1-4), 2001, pp. 161-166
Authors:
Gammer, K
Musser, S
Hutter, H
Citation: K. Gammer et al., Characterization of the 3D-distribution of the components in Al-alloyed high speed steels with SIMS, APPL SURF S, 179(1-4), 2001, pp. 240-244
Authors:
Heinisch, C
Piplits, K
Kubel, F
Schintlmeister, A
Pfluger, E
Hutter, H
Citation: C. Heinisch et al., SIMS investigation of MoS2 based sputtercoatings, APPL SURF S, 179(1-4), 2001, pp. 269-274
Authors:
Mayerhofer, KE
Neubauer, E
Eisenmenger-Sittner, C
Hutter, H
Citation: Ke. Mayerhofer et al., Characterisation of Cr intermediate layers in Cu-C-system with SIMS method, APPL SURF S, 179(1-4), 2001, pp. 275-280
Authors:
Hutter, H
Citation: H. Hutter, On friendship, CONT SOCIOL, 30(6), 2001, pp. 579-581
Authors:
Constantinides, I
Gritsch, M
Adriaens, A
Hutter, H
Adams, F
Citation: I. Constantinides et al., Microstructural characterisation of five simulated archaeological copper alloys using light microscopy, scanning electron microscopy, energy dispersive X-ray microanalysis and secondary ion mass spectrometry, ANALYT CHIM, 440(2), 2001, pp. 189-198
Authors:
Wolkenstein, MG
Hutter, H
Citation: Mg. Wolkenstein et H. Hutter, Compression of secondary ion microscopy image sets using a three-dimensional wavelet transformation, MICROS MICR, 6(1), 2000, pp. 68-75
Authors:
Hutter, H
Citation: H. Hutter, New ways to look at axons in Caenorhabditis elegans, MICROSC RES, 48(1), 2000, pp. 47-54
Authors:
Ai, XT
Hutter, H
Gritsch, M
Borner, H
Sunderkotter, JD
Bubert, H
Jenett, H
Citation: Xt. Ai et al., Al and Ti secondary neutral and secondary ion emission from oxide samples in the high-frequency sputtering mode of HF-plasma SNMS, FRESEN J AN, 366(1), 2000, pp. 41-47
Authors:
Nikolov, SG
Wolkenstein, M
Hutter, H
Citation: Sg. Nikolov et al., Wavelet Analysis and Processing of 2-D and 3-D Analytical images, DATA HAND S, 22, 2000, pp. 479-550
Authors:
Stubbings, TC
Pollak, C
Hutter, H
Citation: Tc. Stubbings et al., Improving 3D visualisation of image stacks by correction of inhomogeneous sample illumination: application to SIMS imaging, J TR MICROP, 18(3), 2000, pp. 339-347
Authors:
Wolkenstein, M
Kolber, T
Nikolov, S
Hutter, H
Citation: M. Wolkenstein et al., Detection of edges in analytical images using wavelet maxima, J TR MICROP, 18(1), 2000, pp. 1-14
Authors:
Blaschitz, A
Hutter, H
Leitner, V
Pilz, S
Wintersteiger, R
Dohr, G
Sedlmayr, P
Citation: A. Blaschitz et al., Reaction patterns of monoclonal antibodies to HLA-G in human tissues and on cell lines: A comparative study, HUMAN IMMUN, 61(11), 2000, pp. 1074-1085
Authors:
Kolber, T
Piplits, K
Dreer, S
Mersdorf, E
Haubner, R
Hutter, H
Citation: T. Kolber et al., SIMS: a capable method for BCN quantification, APPL SURF S, 167(1-2), 2000, pp. 79-88
Authors:
Gritsch, M
Piplits, K
Hutter, H
Wilhartitz, P
Wildner, H
Martinz, HP
Citation: M. Gritsch et al., Investigations on the oxidation behavior of technical molybdenum foils by means of secondary-ion mass spectrometry, SURF SCI, 454, 2000, pp. 284-288
Authors:
Hutter, H
Vogel, BE
Plenefisch, JD
Norris, CR
Proenca, RB
Spieth, J
Guo, CB
Mastwal, S
Zhu, XP
Scheel, J
Hedgecock, EM
Citation: H. Hutter et al., Cell biology: Conservation and novelty in the evolution of cell adhesion and extracellular matrix genes, SCIENCE, 287(5455), 2000, pp. 989-994
Authors:
Gritsch, M
Hutter, H
Holzer, L
Tasch, S
Citation: M. Gritsch et al., Local ions distribution inhomogeneities in polymer based light emitting cells, MIKROCH ACT, 135(3-4), 2000, pp. 131-137
Authors:
Kolber, T
Piplits, K
Palmetshofer, L
Hutter, H
Citation: T. Kolber et al., Characterization of the element distribution within TiN coatings with SIMS, MIKROCH ACT, 135(1-2), 2000, pp. 105-111
Authors:
Dreer, S
Wilhartitz, P
Piplits, K
Hutter, H
Kopnarski, M
Friedbacher, G
Citation: S. Dreer et al., Quantitative sputter depth profiling of silicon- and aluminium oxynitride films, MIKROCH ACT, 133(1-4), 2000, pp. 75-87