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Results: 1-14 |
Results: 14

Authors: Kim, CC Kim, JK Lee, JL Je, JH Yi, MS Noh, DY Hwu, Y Ruterana, P
Citation: Cc. Kim et al., High-temperature structural behavior of Ni/Au contact on GaN (0001), MRS I J N S, 6(4), 2001, pp. 1-7

Authors: Hwu, Y Tsai, WL Hsieh, HH Je, JH Kang, HS Kim, IW Lee, KH Kim, HJ Lai, B Margaritondo, G
Citation: Y. Hwu et al., Collimation-enhanced micro-radiography in real-time, NUCL INST A, 467, 2001, pp. 1294-1300

Authors: Schmidt, O Fecher, GH Hwu, Y Schonhense, G
Citation: O. Schmidt et al., The spatial distribution of non-linear effects in multi-photon photoemission from metallic adsorbates on Si(111), SURF SCI, 482, 2001, pp. 687-692

Authors: Hwu, Y Tsai, WL Lai, B Je, JH Fecher, GH Bertolo, M Margaritondo, G
Citation: Y. Hwu et al., Using photoelectron emission microscopy with hard-X-rays, SURF SCI, 480(3), 2001, pp. 188-195

Authors: Kim, HJ Hong, JO Lee, KH Jung, HJ Kim, EK Je, JH Kim, IW Hwu, Y Tsai, WL Seong, JK Lee, SW Yoo, HS
Citation: Hj. Kim et al., Phantom and animal imaging studies using PLS synchrotron X-rays, IEEE NUCL S, 48(3), 2001, pp. 837-842

Authors: Kim, CC Kim, JK Lee, JL Je, JH Yi, MS Noh, DY Hwu, Y Ruterana, P
Citation: Cc. Kim et al., Catalytic role of Au in Ni/Au contact on GaN(0001), APPL PHYS L, 78(24), 2001, pp. 3773-3775

Authors: Fecher, GH Hwu, Y
Citation: Gh. Fecher et Y. Hwu, Photoabsorption and MXCD in photoemission microscopy for characterization of advanced materials, JPN J A P 1, 38, 1999, pp. 313-316

Authors: Hwu, Y Tsai, WL Chang, LW Chen, CH Wu, CC Noh, DY Je, JH Fecher, GH Bertolo, M Berger, H Margaritondo, G
Citation: Y. Hwu et al., The development and application of imaging EXAFS spectromicroscopy, JPN J A P 1, 38, 1999, pp. 646-649

Authors: Fecher, GH Hwu, Y Yao, YD Lee, YY Chow, GM Swiech, W
Citation: Gh. Fecher et al., Photoabsorption and MXCD in photoemission microscopy for characterisation of advanced materials, J ELEC SPEC, 103, 1999, pp. 937-942

Authors: Hwu, Y Tsai, WL Lai, B Mancini, DC Je, JH Noh, DY Youn, HS Hwang, CS Cerrina, F Swiech, W Bertolo, M Tromba, G Margaritondo, G
Citation: Y. Hwu et al., Use of photoelectron microscopes as X-ray detectors for imaging and other applications, NUCL INST A, 437(2-3), 1999, pp. 516-520

Authors: Kim, HJ Noh, DY Je, JH Hwu, Y
Citation: Hj. Kim et al., Evolution of surface morphology during Fe/Si(111) and Fe/Si(001) heteroepitaxy, PHYS REV B, 59(7), 1999, pp. 4650-4653

Authors: Hwu, Y Hsieh, HH Lu, MJ Tsai, WL Lin, HM Goh, WC Lai, B Je, JH Kim, CK Noh, DY Youn, HS Tromba, G Margaritondo, G
Citation: Y. Hwu et al., Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms, J APPL PHYS, 86(8), 1999, pp. 4613-4618

Authors: Hwu, Y Lai, B Mancini, DC Je, JH Noh, DY Bertolo, M Tromba, G Margaritondo, G
Citation: Y. Hwu et al., Coherence based contrast enhancement in x-ray radiography with a photoelectron microscope, APPL PHYS L, 75(16), 1999, pp. 2377-2379

Authors: Margaritondo, G Tromba, G Hwu, Y Grioni, M
Citation: G. Margaritondo et al., Coherent x-rays in the world of nanoscience, PHYS LOW-D, 12, 1998, pp. 39-54
Risultati: 1-14 |