Authors:
INUSHIMA T
OGASAWARA A
SHIRAISHI T
OHYA S
KARASAWA S
SHIOMI H
Citation: T. Inushima et al., ON THE PROPERTIES OF IMPURITY BANDS GENERATED IN P-TYPE HOMOEPITAXIALDIAMOND, DIAMOND AND RELATED MATERIALS, 7(6), 1998, pp. 874-878
Authors:
KOIDE M
HORIUCHI T
INUSHIMA T
LEE BJ
TOBAYAMA M
KOINUMA H
Citation: M. Koide et al., A NOVEL LOW-TEMPERATURE PLASMA GENERATOR WITH ALUMINA-COATED ELECTRODE FOR OPEN-AIR MATERIAL PROCESSING, Thin solid films, 316(1-2), 1998, pp. 65-67
Citation: S. Matsumura et al., LATTICE STABILITY STUDY OF NITRIDE SEMICONDUCTORS BY THE USE OF MOLECULAR-DYNAMICS CALCULATION, Journal of crystal growth, 190, 1998, pp. 696-700
Authors:
OGASAWARA A
INUSHIMA T
SHIRAISHI T
OHYA S
KARASAWA S
SHIOMI H
Citation: A. Ogasawara et al., OPTICAL AND ELECTRICAL INVESTIGATION OF BORON-DOPED HOMOEPITAXIAL DIAMOND, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 835-838
Authors:
INUSHIMA T
NAKAMA T
SHIRAISHI T
MITSUHASHI M
WATANABE T
Citation: T. Inushima et al., CAPACITANCE-VOLTAGE MEASUREMENTS ON METAL-SIO2-BORON-DOPED HOMOEPITAXIAL DIAMOND, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 852-855
Authors:
HA H
MOON BK
HORIUCHI T
INUSHIMA T
ISHIWARA H
KOINUMA H
Citation: H. Ha et al., STRUCTURE AND ELECTRIC PROPERTIES OF TIO2 FILMS PREPARED BY COLD-PLASMA TORCH UNDER ATMOSPHERIC-PRESSURE, Materials science & engineering. B, Solid-state materials for advanced technology, 41(1), 1996, pp. 143-147
Authors:
INUSHIMA T
KUSUMOTO N
KUBO N
ZHANG HY
YAMAZAKI S
Citation: T. Inushima et al., PHASE-TRANSFORMATION IN AMORPHOUS-SILICON UNDER EXCIMER-LASER ANNEALING STUDIES BY RAMAN-SPECTROSCOPY AND MOBILITY MEASUREMENTS, Journal of applied physics, 79(12), 1996, pp. 9064-9073
Citation: N. Kubo et al., CHARACTERISTICS OF POLYCRYSTALLINE-SI THIN-FILM TRANSISTORS FABRICATED BY EXCIMER-LASER ANNEALING METHOD, I.E.E.E. transactions on electron devices, 41(10), 1994, pp. 1876-1879
Citation: R. Vaitkus et al., ENHANCEMENT OF PHOTOSENSITIVITY BY ULTRAVIOLET-IRRADIATION AND PHOTOCONDUCTIVITY SPECTRA OF DIAMOND THIN-FILMS, Applied physics letters, 62(19), 1993, pp. 2384-2386