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Results:
1-15
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Results: 15
Authors:
HOLLKOTT J
KAHLMANN F
JAEKEL C
HU S
SPANGENBERG B
KURZ H
Citation: J. Hollkott et al., SUB-100 NM LITHOGRAPHY AND HIGH-ASPECT-RATIO MASKS FOR FABRICATION OFJOSEPHSON DEVICES BY ION-IMPLANTATION, Microelectronic engineering, 42, 1998, pp. 403-406
Authors:
JAEKEL C
ROSKOS HG
KURZ H
Citation: C. Jaekel et al., ULTRAFAST OPTOELECTRONIC SWITCHES BASED ON HIGH-T-C SUPERCONDUCTORS, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 3722-3725
Authors:
JAEKEL C
ROSKOS HG
KURZ H
Citation: C. Jaekel et al., EMISSION OF PICOSECOND ELECTROMAGNETIC PULSES FROM OPTICALLY-EXCITED SUPERCONDUCTING BRIDGES, Physical review. B, Condensed matter, 54(10), 1996, pp. 6889-6892
Authors:
FRANCOIS I
JAEKEL C
KYAS G
DIERICKX D
VANDERBIEST O
HEERES RM
MOSHCHALKOV VV
BRUYNSERAEDE Y
ROSKOS HG
BORGHS G
KURZ H
Citation: I. Francois et al., INFLUENCE OF PR DOPING AND OXYGEN DEFICIENCY ON THE SCATTERING BEHAVIOR OF YBA2CU3O7 THIN-FILMS, Physical review. B, Condensed matter, 53(18), 1996, pp. 12502-12508
Authors:
BARTH R
SIEWERT J
SPANGENBERG B
JAEKEL C
KURZ H
UTZ B
PRUSSEIT W
KINDER H
WOLF H
Citation: R. Barth et al., SILICON MICROMACHINING TECHNIQUE FOR FABRICATING HIGH-TEMPERATURE SUPERCONDUCTING MICROBOLOMETERS, Vacuum, 47(9), 1996, pp. 1129-1132
Authors:
JAEKEL C
KYAS G
ROSKOS HG
KURZ H
KABIUS B
MEERTENS D
PRUSSEIT W
UTZ B
Citation: C. Jaekel et al., MICROWAVE PROPERTIES AND STRAIN-INDUCED LATTICE-DEFECTS OF C-AXIS-ORIENTED YBA2CU3O7-DELTA THIN-FILMS ON SILICON, Journal of applied physics, 80(6), 1996, pp. 3488-3492
Authors:
JAEKEL C
FRANCOIS I
KYAS G
HUNING F
ROSKOS HG
BORGHS G
KURZ H
Citation: C. Jaekel et al., MICROWAVE SURFACE IMPEDANCE MEASUREMENTS ON HIGH-T-C SUPERCONDUCTORS, Czechoslovak journal of Physics, 46, 1996, pp. 1117-1118
Authors:
BARTH R
SIEWERT J
SPANGENBERG B
JAEKEL C
KURZ H
UTZ B
PRUSSEIT W
KINDER H
WOLF H
Citation: R. Barth et al., MICROFABRICATED FREESTANDING EPITAXIAL Y-BA-CU-O MICROBOLOMETERS ON SILICON SUBSTRATES, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 2423-2426
Authors:
BARTH R
SIEWERT J
SPANGENBERG B
JAEKEL C
KURZ H
UTZ B
PRUSSEIT W
WOLF H
Citation: R. Barth et al., HIGH-TC AIR-BRIDGE MICROBOLOMETERS FABRICATED BY SILICON MICROMACHINING TECHNIQUE, Microelectronic engineering, 27(1-4), 1995, pp. 499-502
Authors:
BARTH R
SIEWERT J
JAEKEL C
SPANGENBERG B
KURZ H
PRUSSEIT W
UTZ B
WOLF H
Citation: R. Barth et al., EPITAXIAL YBA2CU3O7-DELTA AIR-BRIDGE MICROBOLOMETERS ON SILICON SUBSTRATES, Journal of applied physics, 78(6), 1995, pp. 4218-4221
Authors:
SCHWEDLER R
BRUGGEMANN F
JAEKEL C
KOHL A
BRITTNER S
KURZ H
Citation: R. Schwedler et al., QUANTITATIVE COMPARISON OF MASS-SPECTROMETRY AND PHOTOLUMINESCENCE ONINASP INP MULTIPLE-QUANTUM-WELL STRUCTURES/, Materials science & engineering. B, Solid-state materials for advanced technology, 28(1-3), 1994, pp. 319-322
Authors:
JAEKEL C
BARTH R
ROSKOS HG
KURZ H
Citation: C. Jaekel et al., END-POINT DETECTION BY SPUTTERED NEUTRAL MASS-SPECTROMETRY IN ION MILLING OF PREPATTERNED SEMICONDUCTOR AND HIGH-T(C) SUPERCONDUCTOR FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(5), 1994, pp. 2830-2833
Authors:
BARTH R
SIEWERT J
SPANGENBERG B
JAEKEL C
KURZ H
PRUSSEIT W
KINDER H
Citation: R. Barth et al., FREESTANDING EPITAXIAL YBA2CU3O7 MICROBOLOMETERS ON SILICON SUBSTRATES, Cryogenics, 34, 1994, pp. 871-874
Authors:
JAEKEL C
WASCHKE C
ROSKOS HG
KURZ H
Citation: C. Jaekel et al., SURFACE-RESISTANCE AND PENETRATION DEPTH OF YBA2CU3O7-DELTA THIN-FILMS ON SILICON AT ULTRAHIGH FREQUENCIES, Applied physics letters, 64(24), 1994, pp. 3326-3328
Authors:
BARTH R
SPANGENBERG B
JAEKEL C
ROSKOS HG
KURZ H
HOLZAPFEL B
Citation: R. Barth et al., OPTIMIZATION OF YBA2CU3O7-DELTA SUBMICROMETER STRUCTURE FABRICATION, Applied physics letters, 63(8), 1993, pp. 1149-1151
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1-15
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