Authors:
OGG S
LESAGE S
JERVIS BW
MAIDON Y
ZIMMER T
Citation: S. Ogg et al., MULTIPLE-FAULT DIAGNOSIS IN ANALOG CIRCUITS USING TIME-DOMAIN RESPONSE FEATURES AND MULTILAYER PERCEPTRONS, IEE proceedings. Circuits, devices and systems, 145(4), 1998, pp. 213-218
Citation: Y. Maidon et al., DIAGNOSIS OF MULTIFAULTS IN ANALOG CIRCUITS USING MULTILAYER PERCEPTRONS, IEE proceedings. Circuits, devices and systems, 144(3), 1997, pp. 149-154
Citation: S. Yu et al., DIAGNOSIS OF CMOS OP-AMPS WITH GATE OXIDE SHORT FAULTS USING MULTILAYER PERCEPTRONS, IEEE transactions on computer-aided design of integrated circuits and systems, 16(8), 1997, pp. 930-935
Citation: D. Tsaptsinos et Bw. Jervis, HYBRID KNOWLEDGE-BASED SYSTEM MULTILAYER PERCEPTRON APPROACH FOR THE POST-ASSEMBLY TUNING OF ELECTRONIC FILTERS, IEE proceedings. Circuits, devices and systems, 142(5), 1995, pp. 277-281
Authors:
SAATCHI MR
OKE S
ALLEN EM
JERVIS BW
HUDSON N
Citation: Mr. Saatchi et al., SIGNAL-PROCESSING OF THE CONTINGENT NEGATIVE-VARIATION IN SCHIZOPHRENIA USING MULTILAYER PERCEPTRONS AND PREDICTIVE STATISTICAL DIAGNOSIS, IEE proceedings. Science, measurement and technology, 142(4), 1995, pp. 269-276
Authors:
JERVIS BW
SAATCHI MR
LACEY A
ROBERTS T
ALLEN EM
HUDSON NR
OKE S
GRIMSLEY M
Citation: Bw. Jervis et al., ARTIFICIAL NEURAL-NETWORK AND SPECTRUM ANALYSIS-METHODS FOR DETECTINGBRAIN DISEASES FROM THE CNV RESPONSE IN THE ELECTROENCEPHALOGRAM, IEE proceedings. Science, measurement and technology, 141(6), 1994, pp. 432-440
Authors:
VANDENBERGLENSSEN MMC
VANGISBERGEN JAM
JERVIS BW
Citation: Mmc. Vandenberglenssen et al., COMPARISON OF 2 METHODS FOR CORRECTING OCULAR ARTIFACTS IN EEGS, Medical & biological engineering & computing, 32(5), 1994, pp. 501-511
Authors:
YU S
JERVIS BW
ECKERSALL KR
BELL IM
HALL AG
TAYLOR GE
Citation: S. Yu et al., NEURAL-NETWORK APPROACH TO FAULT-DIAGNOSIS IN CMOS OPAMPS WITH GATE OXIDE SHORT FAULTS, Electronics Letters, 30(9), 1994, pp. 695-696
Authors:
COLLINS P
YU S
ECKERSALL KR
JERVIS BW
BELL IM
TAYLOR GE
Citation: P. Collins et al., APPLICATION OF KOHONEN AND SUPERVISED FORCED ORGANIZATION MAPS TO FAULT-DIAGNOSIS IN CMOS OPAMPS, Electronics Letters, 30(22), 1994, pp. 1846-1847
Authors:
OKE S
SAATCHI R
ALLEN E
HUDSON NR
JERVIS BW
Citation: S. Oke et al., THE CONTINGENT NEGATIVE-VARIATION IN POSITIVE AND NEGATIVE TYPES OF SCHIZOPHRENIA, The American journal of psychiatry, 151(3), 1994, pp. 432-433
Citation: Bw. Jervis, AN EXPERT SYSTEMS COURSE FOR STUDENTS OF ELECTRONIC ENGINEERING, International Journal of Electrical Engineering Education, 30(2), 1993, pp. 170-181