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Results: 1-9 |
Results: 9
ANGSTROM-LEVEL, REAL-TIME CONTROL OF THE FORMATION OF QUANTUM DEVICES
Authors: CARLSSON SB DEPPERT K JUNNO T MAGNUSSON MH MONTELIUS L SAMUELSON L
Citation: Sb. Carlsson et al., ANGSTROM-LEVEL, REAL-TIME CONTROL OF THE FORMATION OF QUANTUM DEVICES, Semiconductor science and technology, 13(8A), 1998, pp. 119-123
SIZE-REDUCTION OF SELF-ASSEMBLED QUANTUM DOTS BY ANNEALING
Authors: JOHANSSON J SEIFERT W ZWILLER V JUNNO T SAMUELSON L
Citation: J. Johansson et al., SIZE-REDUCTION OF SELF-ASSEMBLED QUANTUM DOTS BY ANNEALING, Applied surface science, 134(1-4), 1998, pp. 47-52
ASSEMBLY AND ANALYSIS OF QUANTUM DEVICES USING SPM BASED METHODS
Authors: MONTELIUS L JUNNO T CARLSSON SB MAGNUSSON MH DEPPERT K XU H SAMUELSON L
Citation: L. Montelius et al., ASSEMBLY AND ANALYSIS OF QUANTUM DEVICES USING SPM BASED METHODS, Microelectronics and reliability, 38(6-8), 1998, pp. 943-950
GROWTH OF SELF-ASSEMBLED INAS AND INASXP1-X DOTS ON INP BY METALORGANIC VAPOR-PHASE EPITAXY
Authors: CARLSSON N JUNNO T MONTELIUS L PISTOL ME SAMUELSON L SEIFERT W
Citation: N. Carlsson et al., GROWTH OF SELF-ASSEMBLED INAS AND INASXP1-X DOTS ON INP BY METALORGANIC VAPOR-PHASE EPITAXY, Journal of crystal growth, 191(3), 1998, pp. 347-356
A REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AND ATOMIC-FORCE MICROSCOPY STUDY OF THE CHEMICAL BEAM EPITAXIAL-GROWTH OF INAS AND INP ISLANDS ON (001)GAP
Authors: JUNNO B JUNNO T MILLER MS SAMUELSON L
Citation: B. Junno et al., A REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AND ATOMIC-FORCE MICROSCOPY STUDY OF THE CHEMICAL BEAM EPITAXIAL-GROWTH OF INAS AND INP ISLANDS ON (001)GAP, Applied physics letters, 72(8), 1998, pp. 954-956
FABRICATION OF QUANTUM DEVICES BY ANGSTROM-LEVEL MANIPULATION OF NANOPARTICLES WITH AN ATOMIC-FORCE MICROSCOPE
Authors: JUNNO T CARLSSON SB XU HQ MONTELIUS L SAMUELSON L
Citation: T. Junno et al., FABRICATION OF QUANTUM DEVICES BY ANGSTROM-LEVEL MANIPULATION OF NANOPARTICLES WITH AN ATOMIC-FORCE MICROSCOPE, Applied physics letters, 72(5), 1998, pp. 548-550
AFM-BASED FABRICATION OF LATERAL SINGLE-ELECTRON TUNNELING STRUCTURESFOR ELEVATED-TEMPERATURE OPERATION
Authors: MONTELIUS L JUNNO T CARLSSON SB SAMUELSON L
Citation: L. Montelius et al., AFM-BASED FABRICATION OF LATERAL SINGLE-ELECTRON TUNNELING STRUCTURESFOR ELEVATED-TEMPERATURE OPERATION, Microelectronic engineering, 35(1-4), 1997, pp. 281-284
CONTROLLED MANIPULATION OF NANOPARTICLES WITH AN ATOMIC-FORCE MICROSCOPE
Authors: JUNNO T DEPPERT K MONTELIUS L SAMUELSON L
Citation: T. Junno et al., CONTROLLED MANIPULATION OF NANOPARTICLES WITH AN ATOMIC-FORCE MICROSCOPE, Applied physics letters, 66(26), 1995, pp. 3627-3629
CONTACT MODE ATOMIC-FORCE MICROSCOPY IMAGING OF NANOMETER-SIZED PARTICLES
Authors: JUNNO T ANAND S DEPPERT K MONTELIUS L SAMUELSON L
Citation: T. Junno et al., CONTACT MODE ATOMIC-FORCE MICROSCOPY IMAGING OF NANOMETER-SIZED PARTICLES, Applied physics letters, 66(24), 1995, pp. 3295-3297
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