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Results: 1-25/35
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Influence of elastic-electron scattering on measurements of silicon dioxide film thicknesses by x-ray photoelectron spectroscopy, J VAC SCI A, 19(5), 2001, pp. 2604-2611
Authors:
Powell, CJ
Jablonski, A
Naumkin, A
Kraut-Vass, A
Conny, JM
Rumble, JR
Citation: Cj. Powell et al., NIST data resources for surface analysis by X-ray photoelectron spectroscopy and Auger electron spectroscopy, J ELEC SPEC, 114, 2001, pp. 1097-1102
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Effects of elastic-electron scattering on measurements of silicon dioxide film thicknesses by X-ray photoelectron spectroscopy, J ELEC SPEC, 114, 2001, pp. 1139-1143
Authors:
Lesiak, B
Kosinski, A
Jablonski, A
Kover, L
Toth, J
Varga, D
Cserny, I
Zagorska, M
Kulszewicz-Bajer, I
Gergely, G
Citation: B. Lesiak et al., Determination of the inelastic mean free path of electrons in polythiophenes using elastic peak electron spectroscopy method, APPL SURF S, 174(1), 2001, pp. 70-85
Authors:
Jablonski, A
Zemek, J
Jiricek, P
Citation: A. Jablonski et al., Elastic electron backscattering from overlayer/substrate systems, SURF INT AN, 31(9), 2001, pp. 825-834
Authors:
Krawczyk, M
Zommer, L
Jablonski, A
Robert, C
Pavluch, J
Bideux, L
Gruzza, B
Citation: M. Krawczyk et al., Electron inelastic mean free paths (IMFPs) in binary Au-Cu alloys determined by elastic peak electron spectroscopy, SURF INT AN, 31(5), 2001, pp. 415-420
Authors:
Tougaard, S
Krawczyk, M
Jablonski, A
Pavluch, J
Toth, J
Varga, D
Gergely, G
Menyhard, M
Sulyok, A
Citation: S. Tougaard et al., Intercomparison of methods for separation of REELS elastic peak intensities for determination of IMFP, SURF INT AN, 31(1), 2001, pp. 1-10
Authors:
Sebag, MG
Braganca, SR
Normann, M
Jablonski, A
Citation: Mg. Sebag et al., The behavior of heavy metals in the process of desulfurization of brazilian coal combustion gases by the addition of limestone, BRAZ J CH E, 18(2), 2001, pp. 139-147
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Comparisons of calculated and measured effective attenuation lengths for silicon dioxide over a wide electron energy range, SURF SCI, 488(1-2), 2001, pp. L547-L552
Authors:
Lassen, TS
Tougaard, S
Jablonski, A
Citation: Ts. Lassen et al., Practical correction procedures for elastic electron scattering effects inARXPS, SURF SCI, 481(1-3), 2001, pp. 150-162
Authors:
Zemek, J
Jiricek, P
Hucek, S
Jablonski, A
Lesiak, B
Citation: J. Zemek et al., Escape probability of photoelectrons from silver sulphide, SURF SCI, 473(1-2), 2001, pp. 8-16
Authors:
Sobczak, JW
Kosinski, A
Jablonski, A
Palczewska, W
Citation: Jw. Sobczak et al., Catalytic reactivity and surface chemistry of polyaniline(EB)-Pd-H2O systems, TOP CATAL, 11(1-4), 2000, pp. 307-316
Authors:
Gottzein, E
Fichter, W
Jablonski, A
Juckenhofel, O
Mittnacht, M
Muller, C
Surauer, M
Citation: E. Gottzein et al., Challenges in the control and autonomy of communications satellites, CON ENG PR, 8(4), 2000, pp. 409-427
Authors:
Lesiak, B
Jablonski, A
Zemek, J
Trchova, M
Stejskal, J
Citation: B. Lesiak et al., Determination of the inelastic mean free path of electrons in different polyaniline samples, LANGMUIR, 16(3), 2000, pp. 1415-1423
Authors:
Jablonski, A
Powell, CJ
Citation: A. Jablonski et Cj. Powell, Relationships between electron inelastic mean free paths, effective attenuation lengths, and mean escape depths (vol 100, pg 137, 1999), J ELEC SPEC, 107(2), 2000, pp. 201-201
Authors:
Hucek, S
Zemek, J
Jablonski, A
Tilinin, IS
Citation: S. Hucek et al., Emission depth distribution function of Al 2s photoelectrons in Al2O3, SURF REV L, 7(1-2), 2000, pp. 109-114
Authors:
Gergely, G
Menyhard, M
Gurban, S
Benedek, Z
Daroczi, C
Rakovics, V
Toth, J
Varga, D
Krawczyk, M
Jablonski, A
Citation: G. Gergely et al., Experimental determination of the inelastic mean free path of electrons inGaP and InAs, SURF INT AN, 30(1), 2000, pp. 195-198
Authors:
Varga, D
Kover, L
Toth, J
Tokesi, K
Lesiak, B
Jablonski, A
Robert, C
Gruzza, B
Bideux, L
Citation: D. Varga et al., Determination of yield ratios of elastically backscattered electrons for deriving inelastic mean free paths in solids, SURF INT AN, 30(1), 2000, pp. 202-206
Authors:
Lesiak, B
Jablonski, A
Zemek, J
Jiricek, P
Lejcek, P
Cernansky, M
Citation: B. Lesiak et al., Inelastic mean free path measurements of electrons near nickel surfaces, SURF INT AN, 30(1), 2000, pp. 217-221
Authors:
Zemek, J
Jiricek, P
Hucek, S
Lesiak, B
Jablonski, A
Citation: J. Zemek et al., Measurements of the escape probability of photoelectrons and the inelasticmean free path in silver sulphide, SURF INT AN, 30(1), 2000, pp. 222-227
Authors:
Jablonski, A
Citation: A. Jablonski, Determination of the IMFP from electron elastic backscattering probability, SURF INT AN, 29(9), 2000, pp. 582-595
Authors:
Lesiak, B
Kosinski, A
Jablonski, A
Kover, L
Toth, J
Varga, D
Cserny, I
Citation: B. Lesiak et al., Determination of the inelastic mean free path of electrons in polyaniline samples by elastic peak electron spectroscopy, SURF INT AN, 29(9), 2000, pp. 614-623
Authors:
Powell, CJ
Jablonski, A
Citation: Cj. Powell et A. Jablonski, Evaluation of electron inelastic mean free paths for selected elements andcompounds, SURF INT AN, 29(2), 2000, pp. 108-114
Authors:
Lesiak, B
Kosinski, A
Krawczyk, M
Zommer, L
Jablonski, A
Kover, L
Toth, J
Varga, D
Cserny, I
Zemek, J
Jiricek, P
Citation: B. Lesiak et al., Characterization of polyacetylene and polyacetylene doped with palladium, POL J CHEM, 74(6), 2000, pp. 847-865
Authors:
Jablonski, A
Citation: A. Jablonski, Quantitative surface analysis by X-ray photoelectron spectroscopy, POL J CHEM, 74(11), 2000, pp. 1533-1566