Authors:
Sommerhalter, C
Sadewasser, S
Glatzel, T
Matthes, TW
Jager-Waldau, A
Lux-Steiner, MC
Citation: C. Sommerhalter et al., Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells, SURF SCI, 482, 2001, pp. 1362-1367
Authors:
Sommerhalter, C
Glatzel, T
Matthes, TW
Jager-Waldau, A
Lux-Steiner, MC
Citation: C. Sommerhalter et al., Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces, APPL SURF S, 157(4), 2000, pp. 263-268
Authors:
Rumberg, A
Sommerhalter, C
Toplak, M
Jager-Waldau, A
Lux-Steiner, MC
Citation: A. Rumberg et al., ZnSe thin films grown by chemical vapour deposition for application as buffer layer in CIGSS solar cells, THIN SOL FI, 361, 2000, pp. 172-176
Authors:
Birkholz, M
Bohne, W
Rohrich, J
Jager-Waldau, A
Lux-Steiner, MC
Citation: M. Birkholz et al., Stoichiometry and impurity concentrations in II-VI compounds measured by elastic recoil detection analysis (ERDA), J CRYST GR, 197(3), 1999, pp. 571-575
Authors:
Sommerhalter, C
Matthes, TW
Glatzel, T
Jager-Waldau, A
Lux-Steiner, MC
Citation: C. Sommerhalter et al., High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy, APPL PHYS L, 75(2), 1999, pp. 286-288