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Results:
1-9
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Results: 9
Authors:
Mooney, PM
Jordan-Sweet, JL
Christiansen, SH
Citation: Pm. Mooney et al., Scanning x-ray microtopographs of misfit dislocations at SiGe/Si interfaces, APPL PHYS L, 79(15), 2001, pp. 2363-2365
Authors:
Wang, PC
Noyan, IC
Kaldor, SK
Jordan-Sweet, JL
Liniger, EG
Hu, CK
Citation: Pc. Wang et al., Real-time x-ray microbeam characterization of electromigration effects in Al(Cu) wires, APPL PHYS L, 78(18), 2001, pp. 2712-2714
Authors:
Noyan, IC
Wang, PC
Kaldor, SK
Jordan-Sweet, JL
Liniger, EG
Citation: Ic. Noyan et al., Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics, REV SCI INS, 71(5), 2000, pp. 1991-2000
Authors:
Jordan-Sweet, JL
Citation: Jl. Jordan-sweet, Synchrotron X-ray scattering techniques for microelectronics-related materials studies, IBM J RES, 44(4), 2000, pp. 457-476
Authors:
Wang, PC
Noyan, IC
Kaldor, SK
Jordan-Sweet, JL
Liniger, EG
Hu, CK
Citation: Pc. Wang et al., Topographic measurement of electromigration-induced stress gradients in aluminum conductor lines, APPL PHYS L, 76(25), 2000, pp. 3726-3728
Authors:
Mooney, PM
Jordan-Sweet, JL
Noyan, IC
Kaldor, SK
Wang, PC
Citation: Pm. Mooney et al., Images of local tilted regions in strain-relaxed SiGe layers, PHYSICA B, 274, 1999, pp. 608-611
Authors:
Engstrom, C
Birch, J
Hultman, L
Lavoie, C
Cabral, C
Jordan-Sweet, JL
Carlsson, JRA
Citation: C. Engstrom et al., Interdiffusion studies of single crystal TiN/NbN superlattice thin films, J VAC SCI A, 17(5), 1999, pp. 2920-2927
Authors:
Mooney, PM
Jordan-Sweet, JL
Noyan, IC
Kaldor, SK
Wang, PC
Citation: Pm. Mooney et al., Observation of local tilted regions in strain-relaxed SiGe/Si buffer layers using x-ray microdiffraction, APPL PHYS L, 74(5), 1999, pp. 726-728
Authors:
Noyan, IC
Wang, PC
Kaldor, SK
Jordan-Sweet, JL
Citation: Ic. Noyan et al., Deformation field in single-crystal fields semiconductor substrates causedby metallization features, APPL PHYS L, 74(16), 1999, pp. 2352-2354
Risultati:
1-9
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