Authors:
GRIEP S
KEITELSCHULZ D
SCHMITTLANDSIEDEL D
Citation: S. Griep et al., DESIGN BASED FAILURE ANALYSIS AND YIELD IMPROVEMENT IN CMOS-CIRCUITS, Quality and reliability engineering international, 12(4), 1996, pp. 221-227
Citation: F. Schuler et al., MEASUREMENT AND MODELING OF A NEW WIDTH DEPENDENCE OF NMOSFET DEGRADATION, Microelectronics and reliability, 36(11-12), 1996, pp. 1675-1678
Authors:
SCHMITTLANDSIEDEL D
KEITELSCHULZ D
KHARE J
GRIEP S
MALY W
Citation: D. Schmittlandsiedel et al., CRITICAL AREA ANALYSIS FOR DESIGN-BASED YIELD IMPROVEMENT OF VLSI CIRCUITS, Quality and reliability engineering international, 11(4), 1995, pp. 227-232