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Results:
1-8
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Results: 8
Authors:
LEE WP
KHONG YL
Citation: Wp. Lee et Yl. Khong, LASER MICROWAVE PHOTOCONDUCTANCE STUDIES OF ULTRAVIOLET-IRRADIATED SILICON-WAFERS - EFFECT OF METALLIC CONTAMINATION, Journal of the Electrochemical Society, 145(1), 1998, pp. 329-332
Authors:
LEE WP
KHONG YL
MUHAMAD MR
TOU TY
Citation: Wp. Lee et al., THE EFFECT OF ULTRAVIOLET-IRRADIATION ON THE MINORITY-CARRIER RECOMBINATION LIFETIME OF OXIDIZED SILICON-WAFERS, Journal of the Electrochemical Society, 144(5), 1997, pp. 103-105
Authors:
KHONG YL
TAN GS
TAN GA
Citation: Yl. Khong et al., SURFACE AND INTERFACIAL ROUGHNESS OF POLISHED AND OXIDIZED SILICON-WAFERS EVALUATED BY AN INFRARED DIFFERENTIAL INTERFERENCE CONTRAST TECHNIQUE, Journal of the Electrochemical Society, 143(11), 1996, pp. 254-256
Authors:
KHONG YL
Citation: Yl. Khong, LASER-MICROWAVE PHOTOCONDUCTIVITY OF THERMALLY OXIDIZED SILICON-WAFERS - LASER WAVELENGTH AND POWER DEPENDENCE, Journal of the Electrochemical Society, 142(5), 1995, pp. 74-75
Authors:
KHONG YL
COLLINS AT
ALLERS L
Citation: Yl. Khong et al., LUMINESCENCE DECAY TIME STUDIES AND TIME-RESOLVED CATHODOLUMINESCENCESPECTROSCOPY OF CVD DIAMOND, DIAMOND AND RELATED MATERIALS, 3(7), 1994, pp. 1023-1027
Authors:
GHEERAERT E
FONTAINE F
DENEUVILLE A
KHONG YL
COLLINS AT
Citation: E. Gheeraert et al., CHARACTERIZATION OF DEFECTS IN BORON-IMPLANTED CHEMICALLY VAPOR-DEPOSITED DIAMOND FILMS BY ELECTRON-PARAMAGNETIC-RESONANCE AND CATHODOLUMINESCENCE, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 737-740
Authors:
FREITAS JA
DOVERSPIKE K
KLEIN PB
KHONG YL
COLLINS AT
Citation: Ja. Freitas et al., LUMINESCENCE STUDIES OF NITROGEN-DOPED AND BORON-DOPED DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 821-824
Authors:
MARTIN JPD
BOONYARITH T
MANSON NB
KHONG YL
JONES GD
Citation: Jpd. Martin et al., STRAIN BROADENING OF OPTICAL-TRANSITIONS WITH HYPERFINE-STRUCTURE, Physical review. B, Condensed matter, 49(22), 1994, pp. 15495-15497
Risultati:
1-8
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