Citation: A. Khursheed et al., A PORTABLE SCANNING ELECTRON-MICROSCOPE COLUMN DESIGN BASED ON THE USE OF PERMANENT-MAGNETS, Scanning, 20(2), 1998, pp. 87-91
Citation: Y. Zhao et A. Khursheed, AN ON-POLE-PIECE-TIP DEFLECTOR FOR HIGH-RESOLUTION, LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPES, Scanning, 20(1), 1998, pp. 10-16
Citation: A. Khursheed et Sp. Goh, EXPERIMENTAL INVESTIGATION INTO THE USE OF MICRO-EXTRACTION FIELDS FOR ELECTRON-BEAM TESTING, Microelectronic engineering, 34(2), 1997, pp. 171-185
Citation: A. Khursheed et Tp. Fell, SENSITIVITY ANALYSIS FOR THE ICRP PUBLICATION-67 BIOKINETIC MODEL FORPLUTONIUM, Radiation protection dosimetry, 74(1-2), 1997, pp. 63-73
Citation: A. Khursheed et al., SPATIAL VARIATIONS OF FIELD POLARIZATION AND PHASE IN MICROWAVE CAVITIES - APPLICATION TO THE CESIUM FOUNTAIN CAVITY, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 43(2), 1996, pp. 201-210
Citation: A. Khursheed et al., SIMPLIFIED ORGAN RETENTION FUNCTIONS FOR PHYSIOLOGICALLY-BASED RECYCLING BIOKINETIC MODELS, Health physics, 70(5), 1996, pp. 656-664
Citation: Ar. Dinnis et A. Khursheed, VOLTAGE MEASUREMENTS ON INTEGRATED-CIRCUITS USING A TIME-OF-FLIGHT ELECTRON SPECTROMETER, Microelectronic engineering, 23(1-4), 1994, pp. 395-398
Citation: A. Khursheed, THE BOUNDARY-FITTED COORDINATE METHOD TO IMPROVE THE NUMERICAL-ANALYSIS OF ELECTRON-OPTICAL SYSTEMS, Scanning, 16(4), 1994, pp. 201-208
Citation: Ar. Dinnis et A. Khursheed, TIME-OF-FLIGHT ELECTRON SPECTROMETER FOR VOLTAGE MEASUREMENTS ON INTEGRATED-CIRCUITS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2452-2455