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Results: 1-18 |
Results: 18

Authors: KING WE SCHWARTZ AJ
Citation: We. King et Aj. Schwartz, TOWARD OPTIMIZATION OF THE GRAIN-BOUNDARY-CHARACTER-DISTRIBUTION IN OFE COPPER, Scripta materialia, 38(3), 1998, pp. 449-455

Authors: SCHWARTZ AJ KING WE
Citation: Aj. Schwartz et We. King, THE POTENTIAL ENGINEERING OF GRAIN-BOUNDARIES THROUGH THERMOMECHANICAL PROCESSING, JOM, 50(2), 1998, pp. 50-55

Authors: CAMPBELL GH FOILES SM HUANG HC HUGHES DA KING WE LASSILA DH NIKKEL DJ DELARUBIA TD SHU JY SMYSHLYAEV VP
Citation: Gh. Campbell et al., MULTISCALE MODELING OF POLYCRYSTAL PLASTICITY - A WORKSHOP REPORT, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 251(1-2), 1998, pp. 1-22

Authors: KING WE CAMPBELL GH
Citation: We. King et Gh. Campbell, QUANTITATIVE COMPARISON OF HREM IMAGE INTENSITIES WITH IMAGE SIMULATION FOR APPLICATION IN MATERIALS SCIENCE, Physica status solidi. a, Applied research, 166(1), 1998, pp. 343-356

Authors: KING WE CAMPBELL GH FOILES SM COHEN D HANSON KM
Citation: We. King et al., QUANTITATIVE HREM OBSERVATION OF THE SIGMA-11(113) [(1)OVER-BAR-10] GRAIN-BOUNDARY STRUCTURE IN ALUMINUM AND COMPARISON WITH ATOMISTIC SIMULATION/, Journal of Microscopy, 190, 1998, pp. 131-143

Authors: CAMPBELL GH KING WE COHEN D
Citation: Gh. Campbell et al., ANALYSIS OF EXPERIMENTAL ERROR IN HIGH-RESOLUTION ELECTRON-MICROGRAPHS, MICROSCOPY AND MICROANALYSIS, 3(5), 1997, pp. 451-457

Authors: CAMPBELL GH COHEN D KING WE
Citation: Gh. Campbell et al., DATA PREPARATION FOR QUANTITATIVE HIGH-RESOLUTION ELECTRON-MICROSCOPY, MICROSCOPY AND MICROANALYSIS, 3(4), 1997, pp. 299-310

Authors: BRADLEY SA ALLEN CW KING WE
Citation: Sa. Bradley et al., INTRODUCTION, MICROSCOPY AND MICROANALYSIS, 3(2), 1997, pp. 107-107

Authors: DOHERTY RD HUGHES DA HUMPHREYS FJ JONAS JJ JENSEN DJ KASSNER ME KING WE MCNELLEY TR MCQUEEN HJ ROLLETT AD
Citation: Rd. Doherty et al., CURRENT ISSUES IN RECRYSTALLIZATION - A REVIEW, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 238(2), 1997, pp. 219-274

Authors: BRADLEY SA ALLEN CW KING WE
Citation: Sa. Bradley et al., FRONTIERS OF ELECTRON-MICROSCOPY - PROCEEDINGS OF THE 6TH CONFERENCE ON FRONTIERS IN ELECTRON-MICROSCOPY IN MATERIALS SCIENCE - OAK-BROOK, ILLINOIS, USA 4-7 JUNE 1996 - FOREWORD, Ultramicroscopy, 67(1-4), 1997, pp. 7-7

Authors: KING WE
Citation: We. King, TRAGEDY IN THE TECHNETRONIC AGE - WARREN,ROBERT,PENN NEW DAWN, The Mississippi quarterly, 50(1), 1997, pp. 85-100

Authors: KING WE CAMPBELL GH HAUPT DL KINNEY JH RIDDLE RA WIEN WL
Citation: We. King et al., X-RAY TOMOGRAPHIC MICROSCOPY INVESTIGATION OF THE DUCTILE RUPTURE OF AN ALUMINUM FOIL BONDED BETWEEN SAPPHIRE BLOCKS, Scripta metallurgica et materialia, 33(12), 1995, pp. 1941-1946

Authors: KING WE CAMPBELL G GONIS T HENSHALL G LESUER D ZYWICZ E FOILES S
Citation: We. King et al., THEORY, SIMULATION, AND MODELING OF INTERFACES IN MATERIALS-BRIDGING THE LENGTH-SCALE GAP - A WORKSHOP REPORT, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 191(1-2), 1995, pp. 1-16

Authors: BRADLEY SA KING WE ALLEN CW
Citation: Sa. Bradley et al., PREFACE, Journal of Microscopy, 180, 1995, pp. 1-1

Authors: KING WE CAMPBELL GH
Citation: We. King et Gh. Campbell, QUANTITATIVE HREM USING NONLINEAR LEAST-SQUARES METHODS, Ultramicroscopy, 56(1-3), 1994, pp. 46-53

Authors: KING WE CAMPBELL GH
Citation: We. King et Gh. Campbell, DETERMINATION OF THICKNESS AND DEFOCUS BY QUANTITATIVE COMPARISON OF EXPERIMENTAL AND SIMULATED HIGH-RESOLUTION IMAGES, Ultramicroscopy, 51(1-4), 1993, pp. 128-135

Authors: CAMPBELL GH WIEN WL KING WE FOILES SM RUHLE M
Citation: Gh. Campbell et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY INVESTIGATION OF THE (710) TWIN IN NB, Ultramicroscopy, 51(1-4), 1993, pp. 247-263

Authors: BRADLEY SA KING WE
Citation: Sa. Bradley et We. King, FRONTIERS OF ELECTRON-MICROSCOPY IN MATERIALS SCIENCE - PROCEEDINGS OF THE 4TH CONFERENCE ON FRONTIERS OF ELECTRON-MICROSCOPY IN MATERIALS SCIENCE OAKLAND, CA, USA, 21-24 APRIL 1992 - FOREWORD, Ultramicroscopy, 51(1-4), 1993, pp. 180000007-180000007
Risultati: 1-18 |