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Results:
1-15
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Results: 15
Authors:
CZECH N
JUEZLORENZO M
KOLARIK V
STAMM W
Citation: N. Czech et al., INFLUENCE OF THE SURFACE-ROUGHNESS ON THE OXIDE SCALE FORMATION ON MCRALY COATINGS STUDIED IN-SITU BY HIGH-TEMPERATURE X-RAY-DIFFRACTION, Surface & coatings technology, 109(1-3), 1998, pp. 36-42
TRANSFER OF SAMPLES BETWEEN SEPARATED ULTRAHIGH-VACUUM INSTRUMENTS FOR SEMICONDUCTOR SURFACE STUDIES
Authors:
JIRICEK P
CUKR M
KOLARIK V
KOC S
Citation: P. Jiricek et al., TRANSFER OF SAMPLES BETWEEN SEPARATED ULTRAHIGH-VACUUM INSTRUMENTS FOR SEMICONDUCTOR SURFACE STUDIES, Review of scientific instruments, 69(7), 1998, pp. 2804-2805
Authors:
ENGEL W
EISENREICH N
HERRMANN M
KOLARIK V
Citation: W. Engel et al., TEMPERATURE RESOLVED X-RAY-DIFFRACTION AS A TOOL OF THERMAL-ANALYSIS, Journal of thermal analysis, 49(2), 1997, pp. 1025-1037
Authors:
ZUREK Z
JEDLINSKI J
KOWALSKI K
KOWALSKA K
KOLARIK V
ENGEL W
MUSIL J
FIALA P
Citation: Z. Zurek et al., CORROSION OF BOND COAT NI22CR10ALY-ALLOY IN SULFUR-CONTAINING ATMOSPHERE AT TEMPERATURES OF 1173 AND 1273 K, Solid state ionics, 101, 1997, pp. 743-747
Authors:
GROSS M
KOLARIK V
RAHMEL A
Citation: M. Gross et al., SCALE FORMATION ON GAMMA-TIAL DURING OXIDATION AT 800-DEGREES-C AND 900-DEGREES-C IN AIR AND IN HE-PERCENT-O-2(20), Oxidation of metals, 48(1-2), 1997, pp. 171-184
Authors:
MELSHEIMER S
FIETZEK M
KOLARIK V
RAHMEL A
SCHUTZE M
Citation: S. Melsheimer et al., OXIDATION OF THE INTERMETALLICS MOSI2 AND TISI2 - A COMPARISON, Oxidation of metals, 47(1-2), 1997, pp. 139-203
Authors:
ROMMERSKIRCHEN I
KOLARIK V
Citation: I. Rommerskirchen et V. Kolarik, OXIDATION OF BETA-NIAL, UNDOPED AND DOPED WITH CE, Y, HF, Werkstoffe und Korrosion, 47(11), 1996, pp. 625-630
Authors:
MIR S
LUBASZEWSKI M
KOLARIK V
COURTOIS B
Citation: S. Mir et al., FAULT-BASED TESTING AND DIAGNOSIS OF BALANCED FILTERS, Analog integrated circuits and signal processing, 11(1), 1996, pp. 5-19
Authors:
KOLARIK V
MIR S
LUBASZEWSKI M
COURTOIS B
Citation: V. Kolarik et al., ANALOG CHECKERS WITH ABSOLUTE AND RELATIVE TOLERANCES, IEEE transactions on computer-aided design of integrated circuits and systems, 14(5), 1995, pp. 607-612
Authors:
JUEZLORENZO M
KOLARIK V
HERRMANN M
ENGEL W
EISENREICH N
Citation: M. Juezlorenzo et al., TIME AND TEMPERATURE RESOLVED X-RAY-DIFFRACTION FOR STUDIES OF SOLID-STATE REACTIONS AND PHASE-TRANSITIONS, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 163-165
Authors:
PEJCHL D
MULLEROVA I
FRANK L
KOLARIK V
Citation: D. Pejchl et al., SEPARATOR OF PRIMARY AND SIGNAL ELECTRONS FOR VERY-LOW ENERGY SEM, Czechoslovak journal of Physics, 44(3), 1994, pp. 269-276
Authors:
KOLARIK V
JUEZLORENZO M
EISENREICH N
ENGEL W
Citation: V. Kolarik et al., HIGH-TEMPERATURE CORROSION KINETICS BY A FAST X-RAY-DIFFRACTION METHOD APPLIED TO NICKEL, Journal de physique. IV, 3(C9), 1993, pp. 447-452
Authors:
JUEZLORENZO M
KOLARIK V
EISENREICH N
ENGEL W
CRIADO AJ
Citation: M. Juezlorenzo et al., IN-SITU STUDY OF HIGH-TEMPERATURE CORROSION KINETICS OF IRON USING A FAST X-RAY-DIFFRACTION METHOD, Journal de physique. IV, 3(C9), 1993, pp. 461-467
Authors:
KOLARIK V
JUEZLORENZO M
ENGEL W
EISENREICH N
Citation: V. Kolarik et al., KINETICS OF THE ALPHA-FE2O3 FORMATION ON FE3O4 BETWEEN 400 AND 570-DEGREES-C STUDIED BY MEANS OF X-RAY-DIFFRACTION WITH GRAZING-INCIDENCE, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 252-254
Authors:
ENGEL W
EISENREICH N
ALONSO M
KOLARIK V
Citation: W. Engel et al., APPLICATION OF TIME AND TEMPERATURE RESOLVED X-RAY-DIFFRACTION (TRXRD) TO THERMAL-ANALYSIS, Journal of thermal analysis, 40(3), 1993, pp. 1017-1024
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