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Results: 1-9 |
Results: 9

Authors: SEK G MISIEWICZ J RADZIEWICZ D TLACZALA M PANEK M KORBUTOWICZ R
Citation: G. Sek et al., STUDY OF THE NATURE OF LIGHT-HOLE EXCITONIC TRANSITIONS IN INGAAS GAAS QUANTUM-WELL/, Vacuum, 50(1-2), 1998, pp. 199-201

Authors: PASZKIEWICZ R KORBUTOWICZ R RADZIEWICZ D PANEK M PASZKIEWICZ B KOZLOWSKI J BORATYNSKI B TLACZALA M NOVIKOV SV
Citation: R. Paszkiewicz et al., GROWTH AND CHARACTERIZATION OF GAN EPITAXIAL LAYERS, Vacuum, 50(1-2), 1998, pp. 211-214

Authors: SEK G MISIEWICZ J RADZIEWICZ D TLACZALA M PANEK M KORBUTOWICZ R
Citation: G. Sek et al., CRITICAL LAYER THICKNESS OF INGAAS ON GAAS EXAMINED BY PHOTOREFLECTANCE SPECTROSCOPY, Vacuum, 50(1-2), 1998, pp. 219-221

Authors: SEK G CIORGA M MISIEWICZ J RADZIEWICZ D KORBUTOWICZ R PANEK M TLACZALA M
Citation: G. Sek et al., OPTICAL INVESTIGATIONS OF STRAINED INCAAS QUANTUM-WELLS, Advanced materials for optics and electronics, 7(6), 1997, pp. 307-310

Authors: JEZIERSKI K SITAREK P MISIEWICZ J PANEK M SCIANA B KORBUTOWICZ R TLACZALA M
Citation: K. Jezierski et al., SURFACE AND INTERFACE OF GAAS SL-GAAS STRUCTURES INVESTIGATED BY PHOTOREFLECTANCE SPECTROSCOPY/, Vacuum, 48(3-4), 1997, pp. 277-282

Authors: MISIEWICZ J JEZIERSKI K SITAREK P MARKIEWICZ P KORBUTOWICZ R PANEK M SCIANA B TLACZALA M
Citation: J. Misiewicz et al., PHOTOREFLECTANCE CHARACTERIZATION OF GAAS AND GAAS GAALAS STRUCTURES GROWN BY MOCVD/, Advanced materials for optics and electronics, 5(6), 1995, pp. 321-327

Authors: JEZIERSKI K SITAREK P MISIEWICZ J PANEK M SCIANA B KORBUTOWICZ R TLACZALA M
Citation: K. Jezierski et al., INTERFACE AND SURFACE SUBSIGNALS IN PHOTOREFLECTANCE SPECTRA FOR GAASSI-GAAS STRUCTURES/, Acta Physica Polonica. A, 88(4), 1995, pp. 751-754

Authors: JEZIERSKI K MISIEWICZ J MARKIEWICZ P PANEK M SCIANA B TLACZALA M KORBUTOWICZ R
Citation: K. Jezierski et al., INTERFACE AND SURFACE PHOTOREFLECTANCE SPECTRA FOR GAAS SI-GAAS STRUCTURES/, Physica status solidi. a, Applied research, 147(2), 1995, pp. 467-475

Authors: JEZIERSKI K MARKIEWICZ P MISIEWICZ J PANEK M SCIANA B KORBUTOWICZ R TLACZALA M
Citation: K. Jezierski et al., APPLICATION OF KRAMERS-KRONIG ANALYSIS TO THE PHOTOREFLECTANCE SPECTRA OF HEAVILY-DOPED GAAS SI-GAAS STRUCTURES/, Journal of applied physics, 77(8), 1995, pp. 4139-4141
Risultati: 1-9 |