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Results:
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Results: 19
Authors:
WALTON CC
THOMAS G
KORTRIGHT JB
Citation: Cc. Walton et al., X-RAY OPTICAL MULTILAYERS - MICROSTRUCTURE LIMITS ON REFLECTIVITY AT ULTRA-SHORT PERIODS, Acta materialia, 46(11), 1998, pp. 3767-3775
DIRECT EXTRACTION OF EXCHANGE SPLITTINGS FROM MAGNETIC-X-RAY DICHROISM IN PHOTOELECTRON-SPECTROSCOPY
Authors:
TOBIN JG
GOODMAN KW
SCHUMANN FO
WILLIS RF
KORTRIGHT JB
DENLINGER JD
ROTENBERG E
WARWICK A
SMITH NV
Citation: Jg. Tobin et al., DIRECT EXTRACTION OF EXCHANGE SPLITTINGS FROM MAGNETIC-X-RAY DICHROISM IN PHOTOELECTRON-SPECTROSCOPY, Surface science, 395(2-3), 1998, pp. 227-235
Authors:
WARWICK T
FRANCK K
KORTRIGHT JB
MEIGS G
MORONNE M
MYNENI S
ROTENBERG E
SEAL S
STEELE WF
ADE H
GARCIA A
CERASARI S
DELINGER J
HAYAKAWA S
HITCHCOCK AP
TYLISZCZAK T
KIKUMA J
RIGHTOR EG
SHIN HJ
TONNER BP
Citation: T. Warwick et al., A SCANNING-TRANSMISSION X-RAY MICROSCOPE FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE, Review of scientific instruments, 69(8), 1998, pp. 2964-2973
Authors:
TOBIN JG
GOODMAN KW
SCHUMANN FO
WILLIS RF
KORTRIGHT JB
DENLINGER JD
ROTENBERG E
WARWICK A
SMITH NV
Citation: Jg. Tobin et al., GENERALIZED DESCRIPTION OF MAGNETIC-X-RAY CIRCULAR-DICHROISM IN FE 3PPHOTOELECTRON EMISSION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 1766-1769
Authors:
KORTRIGHT JB
KIM SK
WARWICK T
SMITH NV
Citation: Jb. Kortright et al., SOFT-X-RAY CIRCULAR POLARIZER USING MAGNETIC CIRCULAR-DICHROISM AT THE FE L-3 LINE, Applied physics letters, 71(11), 1997, pp. 1446-1448
Authors:
KIM SK
CHERNOV VA
KORTRIGHT JB
KOO YM
Citation: Sk. Kim et al., ANISOTROPIC SHORT-RANGE STRUCTURE OF CO0.16PD0.84 ALLOY-FILMS HAVING PERPENDICULAR MAGNETIC-ANISOTROPY, Applied physics letters, 71(1), 1997, pp. 66-68
Authors:
KORTRIGHT JB
Citation: Jb. Kortright, STATUS AND LIMITATIONS OF MULTILAYER X-RAY INTERFERENCE STRUCTURES, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 271-275
Authors:
LADERMAN SS
FISCHERCOLBRIE A
SHIMAZAKI A
MIYAZAKI K
BRENNAN S
TAKAKURA N
PIANETTA P
KORTRIGHT JB
Citation: Ss. Laderman et al., HIGH-SENSITIVITY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY OF SILICON-WAFERS USING SYNCHROTRON-RADIATION, Analytical sciences, 11(3), 1995, pp. 515-518
Authors:
KORTRIGHT JB
RICE M
CARR R
Citation: Jb. Kortright et al., SOFT-X-RAY FARADAY-ROTATION AT FE L(2,3) EDGES, Physical review. B, Condensed matter, 51(15), 1995, pp. 10240-10243
Authors:
PIANETTA P
TAKAURA N
BRENNAN S
TOMPKINS W
LADERMAN SS
FISCHERCOLBRIE A
SHIMAZAKI A
MIYAZAKI K
MADDEN M
WHERRY DC
KORTRIGHT JB
Citation: P. Pianetta et al., TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY USING SYNCHROTRON-RADIATION FOR WAFER SURFACE TRACE IMPURITY ANALYSIS, Review of scientific instruments, 66(2), 1995, pp. 1293-1297
Authors:
KORTRIGHT JB
RICE M
FRANCK KD
Citation: Jb. Kortright et al., TUNABLE MULTILAYER EUV SOFT-X-RAY POLARIMETER, Review of scientific instruments, 66(2), 1995, pp. 1567-1569
Authors:
CARR R
KORTRIGHT JB
RICE M
LIDIA S
Citation: R. Carr et al., PERFORMANCE OF THE ELLIPTICALLY POLARIZING UNDULATOR ON SPEAR, Review of scientific instruments, 66(2), 1995, pp. 1862-1864
Authors:
SKULINA KM
ALFORD CS
BIONTA RM
MAKOWIECKI DM
GULLIKSON EM
SOUFLI R
KORTRIGHT JB
UNDERWOOD JH
Citation: Km. Skulina et al., MOLYBDENUM BERYLLIUM MULTILAYER MIRRORS FOR NORMAL INCIDENCE IN THE EXTREME-ULTRAVIOLET, Applied optics, 34(19), 1995, pp. 3727-3730
Authors:
WOOD OR
BJORKHOLM JE
FETTER L
HIMEL MD
TENNANT DM
MACDOWELL AA
LAFONTAINE B
GRIFFITH JE
TAYLOR GN
WASKIEWICZ WK
WINDT DL
KORTRIGHT JB
GULLIKSON EK
NGUYEN K
Citation: Or. Wood et al., WAVELENGTH DEPENDENCE OF THE RESIST SIDEWALL ANGLE IN EXTREME-ULTRAVIOLET LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3841-3845
Authors:
BRENNAN S
TOMPKINS W
TAKAURA N
PIANETTA P
LADERMAN SS
FISCHERCOLBRIE A
KORTRIGHT JB
MADDEN MC
WHERRY DC
Citation: S. Brennan et al., WIDE BAND-PASS APPROACHES TO TOTAL-REFLECTION X-RAY-FLUORESCENCE USING SYNCHROTRON-RADIATION, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 417-421
Authors:
NG W
RAYCHAUDHURI AK
LIANG S
SINGH S
SOLAK H
WELNAK J
CERRINA F
MARGARITONDO G
UNDERWOOD JH
KORTRIGHT JB
PERERA RCC
Citation: W. Ng et al., HIGH-RESOLUTION SPECTROMICROSCOPY WITH MAXIMUM - PHOTOEMISSION SPECTROSCOPY REACHES THE 1000-ANGSTROM SCALE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 422-430
Authors:
ANDERS S
ANDERS A
KORTRIGHT JB
YU KM
BROWN IG
IVANOV IC
Citation: S. Anders et al., VACUUM-ARC DEPOSITION OF MULTILAYER X-RAY MIRRORS, Surface & coatings technology, 61(1-3), 1993, pp. 257-261
Authors:
CERRINA F
RAYCHAUDHURI AK
NG W
LIANG S
SINGH S
WELNAK JT
WALLACE JP
CAPASSO C
UNDERWOOD JH
KORTRIGHT JB
PERERA RCC
MARGARITONDO G
Citation: F. Cerrina et al., MICROSCOPIC-SCALE LATERAL INHOMOGENEITIES OF THE PHOTOEMISSION RESPONSE OF CLEAVED GAAS, Applied physics letters, 63(1), 1993, pp. 63-65
Authors:
KORTRIGHT JB
GULLIKSON EM
DENHAM PE
Citation: Jb. Kortright et al., MASKED DEPOSITION TECHNIQUES FOR ACHIEVING MULTILAYER PERIOD VARIATIONS REQUIRED FOR SHORT-WAVELENGTH (68-ANGSTROM) SOFT-X-RAY IMAGING OPTICS, Applied optics, 32(34), 1993, pp. 6961-6968
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1-19
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