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Results: 1-11 |
Results: 11
HIGH-PRECISION DETERMINATION OF ATOMIC POSITIONS IN CRYSTALS - THE CASE OF 6H-SIC AND 4H-SIC
Authors: BAUER A KRAUSSLICH J DRESSLER L KUSCHNERUS P WOLF J GOETZ K KACKELL P FURTHMULLER J BECHSTEDT F
Citation: A. Bauer et al., HIGH-PRECISION DETERMINATION OF ATOMIC POSITIONS IN CRYSTALS - THE CASE OF 6H-SIC AND 4H-SIC, Physical review. B, Condensed matter, 57(5), 1998, pp. 2647-2650
DETERMINATION OF INTERFACIAL ROUGHNESS AND ITS CORRELATION IN SPUTTERED COZR CU MULTILAYERS/
Authors: LANGER J MATTHEIS R KRAUSSLICH J SENZ S HESSE D SCHUHRKE T ZWECK J
Citation: J. Langer et al., DETERMINATION OF INTERFACIAL ROUGHNESS AND ITS CORRELATION IN SPUTTERED COZR CU MULTILAYERS/, Thin solid films, 319(1-2), 1998, pp. 187-190
INVESTIGATION OF GROWTH-CONDITIONS FOR EPITAXIAL-GROWTH OF SIC ON SI IN THE SOLID-SOURCE MOLECULAR-BEAM EPITAXY
Authors: PFENNIGHAUS K FISSEL A KAISER U WENDT M KRAUSSLICH J PEITER G SCHROTER B RICHTER W
Citation: K. Pfennighaus et al., INVESTIGATION OF GROWTH-CONDITIONS FOR EPITAXIAL-GROWTH OF SIC ON SI IN THE SOLID-SOURCE MOLECULAR-BEAM EPITAXY, Materials science & engineering. B, Solid-state materials for advanced technology, 46(1-3), 1997, pp. 164-167
UNUSUAL CRYSTAL-STRUCTURE OF NONSUPERCONDUCTING Y1BA2CU3O7-X FILMS ONBUFFERED SILICON SUBSTRATES
Authors: LINZEN S KRAUSSLICH J KOHLER A SEIDEL P FREITAG B MADER W
Citation: S. Linzen et al., UNUSUAL CRYSTAL-STRUCTURE OF NONSUPERCONDUCTING Y1BA2CU3O7-X FILMS ONBUFFERED SILICON SUBSTRATES, Physica. C, Superconductivity, 290(3-4), 1997, pp. 323-333
CRYSTAL-STRUCTURE OF YBCO THIN-FILMS GROWN AT SUBSTRATE TEMPERATURES OF ABOUT 500-DEGREES-C
Authors: KOHLER A LINZEN S KRAUSSLICH J SEIDEL P FREITAG B MADER W
Citation: A. Kohler et al., CRYSTAL-STRUCTURE OF YBCO THIN-FILMS GROWN AT SUBSTRATE TEMPERATURES OF ABOUT 500-DEGREES-C, Physica. C, Superconductivity, 282, 1997, pp. 571-572
X-RAY DOUBLE DIFFRACTION (UMWEGANREGUNG) IN SIC MONOCRYSTALS
Authors: DRESSLER L GOETZ K KRAUSSLICH J
Citation: L. Dressler et al., X-RAY DOUBLE DIFFRACTION (UMWEGANREGUNG) IN SIC MONOCRYSTALS, Physica status solidi. b, Basic research, 200(2), 1997, pp. 377-383
X-RAY POLYTYPE EXAMINATION OF SIC BULK CRYSTALS IN BACK-REFLECTION GEOMETRY
Authors: DRESSLER L GOETZ K KRAUSSLICH J
Citation: L. Dressler et al., X-RAY POLYTYPE EXAMINATION OF SIC BULK CRYSTALS IN BACK-REFLECTION GEOMETRY, Journal of applied crystallography, 29, 1996, pp. 378-382
PREPARATION OF SIC FILMS BY SOLID-STATE SOURCE EVAPORATION
Authors: FISSEL A SCHROTER B KRAUSSLICH J RICHTER W
Citation: A. Fissel et al., PREPARATION OF SIC FILMS BY SOLID-STATE SOURCE EVAPORATION, Thin solid films, 258(1-2), 1995, pp. 64-66
X-RAY-EXAMINATION OF SIC MONOCRYSTALS
Authors: DRESSLER L GOETZ K KRAUSSLICH J
Citation: L. Dressler et al., X-RAY-EXAMINATION OF SIC MONOCRYSTALS, Physica status solidi. a, Applied research, 148(1), 1995, pp. 81-88
X-RAY, TRANSMISSION ELECTRON-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY CHARACTERIZATION OF SIC THIN-FILMS ON SI(111)
Authors: KRAUSSLICH J FISSEL A KAISER U GOETZ K DRESSLER L
Citation: J. Krausslich et al., X-RAY, TRANSMISSION ELECTRON-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY CHARACTERIZATION OF SIC THIN-FILMS ON SI(111), Journal of physics. D, Applied physics, 28(4), 1995, pp. 759-763
LASER-ABLATED YBCO THIN-FILMS - RELATIONS BETWEEN STRUCTURAL AND ELECTRICAL-PROPERTIES
Authors: ZACH K BORCK J LINZEN S KRAUSSLICH J SCHMIDL F SCHNEIDEWIND H SEIDEL P
Citation: K. Zach et al., LASER-ABLATED YBCO THIN-FILMS - RELATIONS BETWEEN STRUCTURAL AND ELECTRICAL-PROPERTIES, Journal of alloys and compounds, 195(1-2), 1993, pp. 199-202
Risultati: 1-11 |