AAAAAA

   
Results: 1-8 |
Results: 8
CHARACTERIZATION OF A GRADED-INDEX OF REFRACTION SEPARATE-CONFINEMENTHETEROSTRUCTURE (GRINSCH) LASER STRUCTURE USING CONTACTLESS ELECTROREFLECTANCE
Authors: KRYSTEK W LEIBOVITCH M SUN WD POLLAK FH GUMBS G BURNHAM GT WANG X
Citation: W. Krystek et al., CHARACTERIZATION OF A GRADED-INDEX OF REFRACTION SEPARATE-CONFINEMENTHETEROSTRUCTURE (GRINSCH) LASER STRUCTURE USING CONTACTLESS ELECTROREFLECTANCE, Journal of applied physics, 84(4), 1998, pp. 2229-2235
DETERMINATION OF THE CARRIER-TYPE AT III-NITRIDE SEMICONDUCTOR SURFACES INTERFACES USING CONTACTLESS ELECTROREFLECTANCE/
Authors: KRYSTEK W POLLAK FH FENG ZC SCHURMAN M STALL RA
Citation: W. Krystek et al., DETERMINATION OF THE CARRIER-TYPE AT III-NITRIDE SEMICONDUCTOR SURFACES INTERFACES USING CONTACTLESS ELECTROREFLECTANCE/, Applied physics letters, 72(11), 1998, pp. 1353-1355
MBE GROWTH OF LATTICE-MATCHED ZNCDMGSE QUATERNARIES AND ZNCDMGSE ZNCDSE QUANTUM-WELLS ON INP SUBSTRATES/
Authors: TAMARGO MC CAVUS A ZENG LF DAI N BAMBHA N GRAY A SEMENDY F KRYSTEK W POLLAK FH
Citation: Mc. Tamargo et al., MBE GROWTH OF LATTICE-MATCHED ZNCDMGSE QUATERNARIES AND ZNCDMGSE ZNCDSE QUANTUM-WELLS ON INP SUBSTRATES/, Journal of electronic materials, 25(2), 1996, pp. 259-262
TEMPERATURE-DEPENDENCE OF THE DIRECT GAPS OF ZNSE AND ZN0.56CD0.44SE
Authors: MALIKOVA L KRYSTEK W POLLAK FH DAI N CAVUS A TAMARGO MC
Citation: L. Malikova et al., TEMPERATURE-DEPENDENCE OF THE DIRECT GAPS OF ZNSE AND ZN0.56CD0.44SE, Physical review. B, Condensed matter, 54(3), 1996, pp. 1819-1824
CONTACTLESS ELECTROMODULATION FOR THE NONDESTRUCTIVE, ROOM-TEMPERATURE ANALYSIS OF WAFER-SIZED SEMICONDUCTOR-DEVICE STRUCTURES
Authors: POLLAK FH KRYSTEK W LEIBOVITCH M GRAY ML HOBSON WS
Citation: Fh. Pollak et al., CONTACTLESS ELECTROMODULATION FOR THE NONDESTRUCTIVE, ROOM-TEMPERATURE ANALYSIS OF WAFER-SIZED SEMICONDUCTOR-DEVICE STRUCTURES, IEEE journal of selected topics in quantum electronics, 1(4), 1995, pp. 1002-1010
CONTACTLESS ELECTROREFLECTANCE STUDY OF TEMPERATURE-DEPENDENCE OF FUNDAMENTAL-BAND GAP OF ZNSE
Authors: KRYSTEK W MALIKOVA L POLLAK FH TAMARGO MC DAI N ZENG L CAVUS A
Citation: W. Krystek et al., CONTACTLESS ELECTROREFLECTANCE STUDY OF TEMPERATURE-DEPENDENCE OF FUNDAMENTAL-BAND GAP OF ZNSE, Acta Physica Polonica. A, 88(5), 1995, pp. 1013-1017
NONDESTRUCTIVE, ROOM-TEMPERATURE ANALYSIS QUALIFICATION OF WAFER-SIZED SEMICONDUCTOR-DEVICE STRUCTURES USING CONTACTLESS ELECTROMODULATION SPECTROSCOPY
Authors: POLLAK FH QIANG H YAN D KRYSTEK W MONEGER S
Citation: Fh. Pollak et al., NONDESTRUCTIVE, ROOM-TEMPERATURE ANALYSIS QUALIFICATION OF WAFER-SIZED SEMICONDUCTOR-DEVICE STRUCTURES USING CONTACTLESS ELECTROMODULATION SPECTROSCOPY, Solid-state electronics, 38(6), 1995, pp. 1121-1129
ANALYZING SEMICONDUCTOR-DEVICES USING MODULATION SPECTROSCOPY
Authors: POLLAK FH QIANG H YAN D YIN YC KRYSTEK W
Citation: Fh. Pollak et al., ANALYZING SEMICONDUCTOR-DEVICES USING MODULATION SPECTROSCOPY, JOM, 46(9), 1994, pp. 55-59
Risultati: 1-8 |