Authors: KUBBY JA BOLAND JJ

Citation: Ja. Kubby et Jj. Boland, SCANNING-TUNNELING-MICROSCOPY OF SEMICONDUCTOR SURFACES, Surface science reports, 26(3-6), 1996, pp. 61-204

Authors: KUBBY JA GREENE WJ

Citation: Ja. Kubby et Wj. Greene, IMAGING EXTRINSIC DEFECTS AT THE NISI2 SI(111) METAL-SEMICONDUCTOR INTERFACE/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2009-2016

Authors: KUBBY JA GREENE WJ

Citation: Ja. Kubby et Wj. Greene, IMAGING MISFIT DISLOCATIONS IN EPITAXIAL COSI2 SI(111) LAYERS USING QUANTUM-SIZE MICROSCOPY, Surface science, 311(3), 1994, pp. 120000695-120000702

Authors: SOUKIASSIAN P SPIESS L SCHIRM KM MANGAT PS KUBBY JA TANG SP FREEMAN AJ

Citation: P. Soukiassian et al., GEOMETRY AND MODE OF GROWTH OF ALKALI METAL SI(100)2X1 INTERFACES/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1431-1438

Authors: KUBBY JA WANG YR GREENE WJ

Citation: Ja. Kubby et al., IMAGING DEFECT FORMATION IN THE TEMPLATE GROWTH OF NISI2 SI(111) - ANAPPLICATION OF QUANTUM-SIZE MICROSCOPY/, Physical review. B, Condensed matter, 48(7), 1993, pp. 4473-4480

Authors: KUBBY JA GREENE WJ

Citation: Ja. Kubby et Wj. Greene, PARTICLE IN A VARIABLE-SIZE BOX - THE INFLUENCE OF THE TIP IN THIN-FILM ELECTRON INTERFEROMETRY, Physical review. B, Condensed matter, 48(15), 1993, pp. 11249-11255