Authors:
BIESEMANS S
HENDRIKS M
KUBICEK S
DEMEYER K
Citation: S. Biesemans et al., PRACTICAL ACCURACY ANALYSIS OF SOME EXISTING EFFECTIVE CHANNEL-LENGTHAND SERIES RESISTANCE EXTRACTION METHODS FOR MOSFETS, I.E.E.E. transactions on electron devices, 45(6), 1998, pp. 1310-1316
Citation: S. Biesemans et al., TEST STRUCTURE TO INVESTIGATE THE SERIES RESISTANCE COMPONENTS OF SOURCE DRAIN STRUCTURE/, IEEE electron device letters, 18(10), 1997, pp. 477-479
Citation: S. Biesemans et al., NEW CURRENT-DEFINED THRESHOLD VOLTAGE MODEL FROM 2D POTENTIAL DISTRIBUTION CALCULATIONS IN MOSFETS, Solid-state electronics, 39(1), 1996, pp. 43-48