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Results:
1-24
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Results: 24
Authors:
ZHANG Z
KULAKOV MA
BULLEMER B
Citation: Z. Zhang et al., EVOLUTION AND DEGENERATION OF DIMER-ADATOM-STACKING-FAULT STRUCTURE IN SOLID-PHASE EPITAXY ON SI(111) SURFACE OBSERVED BY SCANNING-TUNNELING-MICROSCOPY, Surface review and letters, 5(1), 1998, pp. 21-25
Authors:
KULAKOV MA
HOSTER H
HENN G
BULLEMER B
Citation: Ma. Kulakov et al., MORPHOLOGY AND ATOMIC-STRUCTURE OF SIC(0001) SURFACES - A UHV STM STUDY, Materials science & engineering. B, Solid-state materials for advanced technology, 46(1-3), 1997, pp. 227-230
Authors:
ZHANG Z
KULAKOV MA
BULLEMER B
Citation: Z. Zhang et al., SURFACE-MORPHOLOGY AND RECONSTRUCTIONS OF ULTRA-THIN SI FILMS GROWN BY SOLID-PHRASE EPITAXY, Thin solid films, 294(1-2), 1997, pp. 88-92
Authors:
HOSTER HE
KULAKOV MA
BULLEMER B
Citation: He. Hoster et al., MORPHOLOGY AND ATOMIC-STRUCTURE OF THE SIC(000(1)OVER-BAR)3X3 SURFACERECONSTRUCTION, Surface science, 382(1-3), 1997, pp. 658-665
Authors:
KULAKOV MA
HOSTER H
ZHANG Z
BULLEMER B
Citation: Ma. Kulakov et al., COOLING RATE DETERMINATION OF SI SAMPLES IN A RADIATIVE QUENCH AND OBSERVATION OF AN APPARENT TEMPERATURE SHIFT OF THE 1X1-7X7 SURFACE PHASE-TRANSITION, Surface science, 376(1-3), 1997, pp. 414-418
Authors:
ZHANG Z
KULAKOV MA
BULLEMER B
Citation: Z. Zhang et al., CHARGE-TRANSFER AND REST-ATOM IMAGING IN DIMER-ADATOM-STACKING-FAULT STRUCTURE EVOLUTION OBSERVED BY SCANNING-TUNNELING-MICROSCOPY ON THE SI(111) SURFACE, Surface science, 375(2-3), 1997, pp. 195-202
Authors:
KULAKOV MA
Citation: Ma. Kulakov, GENERATION OF THE SI(111)-(2X1) SURFACE RECONSTRUCTION BY A RAPID RADIATION QUENCH, Surface science, 372(1-3), 1997, pp. 266-270
Authors:
ZHANG Z
KULAKOV MA
BULLEMER B
EISELE I
ZOTOV AV
Citation: Z. Zhang et al., B SI(100) SURFACE - ATOMIC-STRUCTURE AND EPITAXIAL SI OVERGROWTH/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 2684-2689
Authors:
KULAKOV MA
ZHANG Z
ZOTOV AV
BULLEMER B
EISELE I
Citation: Ma. Kulakov et al., STRUCTURE OF THE B SI(100) SURFACE AT LOW BORON COVERAGE STUDIED BY SCANNING-TUNNELING-MICROSCOPY/, Applied surface science, 103(4), 1996, pp. 443-449
Authors:
ZOTOV AV
KULAKOV MA
BULLEMER B
EISELE I
Citation: Av. Zotov et al., SCANNING-TUNNELING-MICROSCOPY STUDY OF SI GROWTH ON A SI(111)ROOT-3X-ROOT-3-B SURFACE, Physical review. B, Condensed matter, 53(19), 1996, pp. 12902-12906
Authors:
ZHANG Z
KULAKOV MA
BULLEMER B
Citation: Z. Zhang et al., SCANNING-TUNNELING-MICROSCOPY STUDY OF SI(100)-C(4X4) STRUCTURE FORMATION BY ANNEALING OF SI EPITAXIAL-FILMS, Surface science, 369(1-3), 1996, pp. 69-75
Authors:
ZHANG Z
KULAKOV MA
BULLEMER B
Citation: Z. Zhang et al., NEW FEATURES OF C-TYPE DEFECTS ON THE SI(100) SURFACE OBSERVED BY SCANNING-TUNNELING-MICROSCOPY, Surface science, 369(1-3), 1996, pp. 131-135
Authors:
ZOTOV AV
KULAKOV MA
RYZHKOV SV
LIFSHITS VG
BULLEMER B
EISELE I
Citation: Av. Zotov et al., SI OVERGROWTH ON SI(111)ROOT-3X-ROOT-3-B SURFACE PHASE, Surface science, 352, 1996, pp. 358-363
Authors:
KULAKOV MA
HENN G
BULLEMER B
Citation: Ma. Kulakov et al., SIC(0001)3X3-SI SURFACE RECONSTRUCTION - A NEW INSIGHT WITH A STM, Surface science, 346(1-3), 1996, pp. 49-54
Authors:
ZOTOV AV
KULAKOV MA
RYZHKOV SV
SARANIN AA
LIFSHITS VG
BULLEMER B
EISELE I
Citation: Av. Zotov et al., STRUCTURAL DEFECTS OF THE SI(111)ROOT-X-ROOT-3-B SURFACE STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Surface science, 345(3), 1996, pp. 313-319
Authors:
KULAKOV MA
Citation: Ma. Kulakov, MORPHOLOGY OF AN AS-GROWN SURFACE OF SIC - DETERMINATION OF STEP FLOWDIRECTION, Journal of crystal growth, 158(3), 1996, pp. 261-267
Authors:
ZHANG Z
KULAKOV MA
BULLEMER B
EISELE I
ZOTOV AV
Citation: Z. Zhang et al., EPITAXIAL-GROWTH OF ULTRATHIN SI CAPS ON SI(100)-B SURFACE STUDIED BYSCANNING-TUNNELING-MICROSCOPY, Applied physics letters, 69(4), 1996, pp. 494-496
Authors:
ZHANG Z
KULAKOV MA
BULLEMER B
EISELE I
ZOTOV AV
Citation: Z. Zhang et al., EPITAXIAL-GROWTH OF ULTRATHIN SI CAPS ON SI(100)B SURFACE STUDIED BY SCANNING-TUNNELING-MICROSCOPY (VOL 69, PG 494, 1996), Applied physics letters, 69(12), 1996, pp. 1813-1813
Authors:
HEUELL P
CUZDI S
KULAKOV MA
BULLEMER B
Citation: P. Heuell et al., AN ULTRA-HIGH-RESOLUTION CONTROL UNIT FOR A SCANNING TUNNELING MICROSCOPE, Thin solid films, 264(2), 1995, pp. 217-222
Authors:
TEUFEL L
HEUELL P
KULAKOV MA
BULLEMER B
Citation: L. Teufel et al., SCANNING-TUNNELING-MICROSCOPY ON QUENCHED SI(111) SURFACES, Thin solid films, 264(2), 1995, pp. 236-239
Authors:
HEUELL P
KULAKOV MA
BULLEMER B
Citation: P. Heuell et al., STEPPED MORPHOLOGY ON 4H AND 15R SILICON-CARBIDE - MODELING BY A RANDOM-WALK, Surface science, 333, 1995, pp. 965-970
Authors:
KULAKOV MA
HEUELL P
TSVETKOV VF
BULLEMER B
Citation: Ma. Kulakov et al., SCANNING-TUNNELING-MICROSCOPY ON THE 6H SIC(0001) SURFACE, Surface science, 315(3), 1994, pp. 248-254
Authors:
HEUELL P
KULAKOV MA
BULLEMER B
Citation: P. Heuell et al., AN ADAPTIVE SCAN GENERATOR FOR A SCANNING TUNNELING MICROSCOPE, Review of scientific instruments, 65(1), 1994, pp. 89-92
Authors:
KULAKOV MA
WERDIN S
HEUELL P
BULLEMER B
Citation: Ma. Kulakov et al., MODELING OF PATTERN GROWTH BY VACANCY DIFFUSION AND TRAPPING ON SI(111)7 X 7 SURFACE, Surface science, 287, 1993, pp. 241-244
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