Authors:
CZEKALAMUKALLED Z
KUZMINSKI S
PLACZEKPOPKO E
SZATKOWSKI J
KOZLOWSKI J
JEDRAL L
Citation: Z. Czekalamukalled et al., HIGH-RESOLUTION DIFFRACTION AND DLTS INVESTIGATION RESULTS OF THE EPITAXIAL GA(1-X)AL(X)S GAAS LAYERS PRODUCED WITH THE MOCVD METHOD/, Vacuum, 48(3-4), 1997, pp. 269-271
Citation: Z. Czekalamukalled et al., PHOTOELECTRONIC PROPERTIES OF THE GAAS, SI EPITAXIAL LAYERS ON THE GAAS SUBSTRATE, Vacuum, 46(5-6), 1995, pp. 489-491
Citation: S. Kuzminski et al., INFLUENCE OF PRODUCTION TECHNOLOGY ON SURFACE-PROPERTIES OF CD0.85MN0.15TE INTRINSIC AND GALLIUM DOPED, Vacuum, 46(5-6), 1995, pp. 501-503