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Results:
1-7
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Results: 7
Authors:
Yoshida, M
Murakami, S
Nakayama, M
Yanagisawa, J
Wakaya, F
Kaito, T
Gamo, K
Citation: M. Yoshida et al., Formation of narrow grooves on thin metal layer by focused ion beam etching, MICROEL ENG, 57-8, 2001, pp. 877-882
Authors:
Kaito, T
Hirata, A
Citation: T. Kaito et A. Hirata, Friction properties of fullerene prepared by heating diamond clusters, NEW DIAM FR, 10(1), 2000, pp. 36-36
Authors:
Matsui, S
Kaito, T
Fujita, J
Komuro, M
Kanda, K
Haruyama, Y
Citation: S. Matsui et al., Three-dimensional nanostructure fabrication by focused-ion-beam chemical vapor deposition, J VAC SCI B, 18(6), 2000, pp. 3181-3184
Authors:
Okada, M
Shimizu, S
Kawata, S
Kaito, T
Citation: M. Okada et al., Stencil reticle repair for electron beam projection lithography, J VAC SCI B, 18(6), 2000, pp. 3254-3258
Authors:
Ukai, S
Mizuta, S
Kaito, T
Okada, H
Citation: S. Ukai et al., In-reactor creep rupture properties of 20% CW modified 316 stainless steel, J NUCL MAT, 278(2-3), 2000, pp. 320-327
Authors:
Shiraiwa, T
Kaito, T
Katayama, T
Ikeda, T
Ishikawa, J
Kurokawa, H
Citation: T. Shiraiwa et al., Preparation of (2S,4R)-2,4-thiazolidinedicarboxylic acid by separation of diastereoisomeric salts with organic amines, CHIRALITY, 11(4), 1999, pp. 326-329
Authors:
Okagawa, T
Matsuoka, K
Kojima, Y
Yoshida, A
Matsui, S
Santo, I
Anazawa, N
Kaito, T
Citation: T. Okagawa et al., Inspection of stencil mask using transmission electrons for character projection electron beam lithography, MICROEL ENG, 46(1-4), 1999, pp. 279-282
Risultati:
1-7
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