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Citation: K. Kassmi et al., Ionizing irradiation effect on the current-voltage characteristics of the metal/ultra-thin oxide/semiconductor structures, EPJ-APPL PH, 8(2), 1999, pp. 171-178
Authors:
Kassmi, K
Nolhier, N
Rossel, P
Tranduc, H
Kouakou, P
Gola, P
El Hitmy, M
Maimouni, R
Citation: K. Kassmi et al., PSPICE model of the power LDMOS transistor for radio frequency applications in the 1.8-2.2 GHz Band, EPJ-APPL PH, 5(2), 1999, pp. 171-178