Authors:
Kawasuso, A
Redmann, F
Krause-Rehberg, R
Yoshikawa, M
Kojima, K
Itoh, H
Citation: A. Kawasuso et al., Positron annihilation due to silicon vacancies in 3C and 6H SiC epitaxial layers induced by 1 MeV electron irradiation, PHYS ST S-B, 223(2), 2001, pp. R8-R10
Authors:
Kawasuso, A
Redmann, F
Krause-Rehberg, R
Frank, T
Weidner, M
Pensl, G
Sperr, P
Itoh, H
Citation: A. Kawasuso et al., Vacancies and deep levels in electron-irradiated 6H SiC epilayers studied by positron annihilation and deep level transient spectroscopy, J APPL PHYS, 90(7), 2001, pp. 3377-3382
Authors:
Hirata, K
Arai, H
Kawasuso, A
Sekiguchi, T
Kobayashi, Y
Okada, S
Citation: K. Hirata et al., Defects in 30 keV Er+-implanted SiO2/Si studied by positron annihilation and cathodoluminescence, J APPL PHYS, 90(1), 2001, pp. 237-242
Authors:
Kawasuso, A
Redmann, F
Krause-Rehberg, R
Weidner, M
Frank, T
Pensl, G
Sperr, P
Triftshauser, W
Itoh, H
Citation: A. Kawasuso et al., Annealing behavior of vacancies and Z(1/2) levels in electron-irradiated 4H-SiC studied by positron annihilation and deep-level transient spectroscopy, APPL PHYS L, 79(24), 2001, pp. 3950-3952
Authors:
Kawasuso, A
Yoshikawa, M
Kojima, K
Okada, S
Ishimiya, A
Citation: A. Kawasuso et al., Rocking curves of reflection high-energy positron diffraction from hydrogen-terminated Si(111) surfaces, PHYS REV B, 61(3), 2000, pp. 2102-2106
Authors:
Kawasuso, A
Arai, H
Hirata, K
Sekiguchi, T
Kobayashi, Y
Okada, S
Citation: A. Kawasuso et al., Effect of radiation damage on luminescence of erbium-implanted SiO2/Si studied by slow positron beam, RADIAT PH C, 58(5-6), 2000, pp. 615-619
Authors:
Kawasuso, A
Kojima, K
Yoshikawa, M
Itoh, H
Narumi, K
Citation: A. Kawasuso et al., Effect of hydrogen etching on 6H SiC surface morphology studied by reflection high-energy positron diffraction and atomic force microscopy, APPL PHYS L, 76(9), 2000, pp. 1119-1121