Authors: Kautz, RL Keller, MW Martinis, JM

Citation: Rl. Kautz et al., Noise-induced leakage and counting errors in the electron pump, PHYS REV B, 62(23), 2000, pp. 15888-15902

Authors: Covington, M Keller, MW Kautz, RL Martinis, JM

Citation: M. Covington et al., Photon-assisted tunneling in electron pumps, PHYS REV L, 84(22), 2000, pp. 5192-5195

Authors: Eichenberger, AL Keller, MW Martinis, JM Zimmerman, NM

Citation: Al. Eichenberger et al., Frequency dependence of a cryogenic capacitor measured using single electron tunneling devices, J L TEMP PH, 118(5-6), 2000, pp. 317-324

Authors: Zimmerman, NM Keller, MW

Citation: Nm. Zimmerman et Mw. Keller, Dynamic input capacitance of single-electron transistors and the effect oncharge-sensitive electrometers, J APPL PHYS, 87(12), 2000, pp. 8570-8574

Authors: Kautz, RL Keller, MW Martinis, JM

Citation: Rl. Kautz et al., Leakage and counting errors in a seven-junction electron pump, PHYS REV B, 60(11), 1999, pp. 8199-8212

Authors: Keller, MW Eichenberger, AL Martinis, JM Zimmerman, NM

Citation: Mw. Keller et al., A capacitance standard based on counting electrons, SCIENCE, 285(5434), 1999, pp. 1706-1709