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Results: 1-8 |
Results: 8
Experimental determination of the Andreev reflection probability using ballistic point contact spectroscopy
Authors: Jakob, M Appenzeller, J Knoch, J Stahl, H Lengeler, B
Citation: M. Jakob et al., Experimental determination of the Andreev reflection probability using ballistic point contact spectroscopy, MAT SCI E C, 15(1-2), 2001, pp. 63-65
Technology for the fabrication of ultrashort channel metal-oxide-semiconductor field-effect transistors
Authors: Knoch, J Appenzeller, J Lengeler, B Martel, R Solomon, P Avouris, P Dieker, C Lu, Y Wang, KL Scholvin, J del Alamo, JA
Citation: J. Knoch et al., Technology for the fabrication of ultrashort channel metal-oxide-semiconductor field-effect transistors, J VAC SCI A, 19(4), 2001, pp. 1737-1741
A 10 nm MOSFET concept
Authors: Appenzeller, J Martel, R Solomon, P Chan, K Avouris, P Knoch, J Benedict, J Tanner, M Thomas, S Wang, KL del Alamo, JA
Citation: J. Appenzeller et al., A 10 nm MOSFET concept, MICROEL ENG, 56(1-2), 2001, pp. 213-219
Preparation of highly transparent superconductor-semiconductor contacts
Authors: Knoch, J Appenzeller, J Lengeler, B
Citation: J. Knoch et al., Preparation of highly transparent superconductor-semiconductor contacts, J APPL PHYS, 88(6), 2000, pp. 3522-3526
Spectroscopic measurements on the Andreev reflection probability as a function of temperature
Authors: Appenzeller, J Jakob, M Stahl, H Knoch, J Lengeler, B
Citation: J. Appenzeller et al., Spectroscopic measurements on the Andreev reflection probability as a function of temperature, APPL PHYS L, 77(4), 2000, pp. 549-551
Scheme for the fabrication of ultrashort channel metal-oxide-semiconductorfield-effect transistors
Authors: Appenzeller, J Martel, R Solomon, P Chan, K Avouris, P Knoch, J Benedict, J Tanner, M Thomas, S Wang, KL del Alamo, JA
Citation: J. Appenzeller et al., Scheme for the fabrication of ultrashort channel metal-oxide-semiconductorfield-effect transistors, APPL PHYS L, 77(2), 2000, pp. 298-300
Direct determination of the Andreev reflection probability by means of point contact spectroscopy
Authors: Jakob, M Stahl, H Knoch, J Appenzeller, J Lengeler, B Hardtdegen, H Luth, H
Citation: M. Jakob et al., Direct determination of the Andreev reflection probability by means of point contact spectroscopy, APPL PHYS L, 76(9), 2000, pp. 1152-1154
Direct determination of the Andreev reflection probability by means of point contact spectroscopy (vol 76, pg 1152 2000)
Authors: Jakob, M Stahl, H Knoch, J Appenzeller, J Lengeler, B Hardtdegen, H Luth, H
Citation: M. Jakob et al., Direct determination of the Andreev reflection probability by means of point contact spectroscopy (vol 76, pg 1152 2000), APPL PHYS L, 76(19), 2000, pp. 2800-2800
Risultati: 1-8 |