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Results: 1-8 |
Results: 8
Determination of parameters for channeling of protons in SiC polytype crystals in the backscattering geometry
Authors: Kokkoris, M Kossionides, S Vlastou, R Aslanoglou, XA Grotzschel, R Nsouli, B Kuznetsov, A Petrovic, S Paradellis, T
Citation: M. Kokkoris et al., Determination of parameters for channeling of protons in SiC polytype crystals in the backscattering geometry, NUCL INST B, 184(3), 2001, pp. 319-326
Fluorine determination in human healthy and carious teeth using the PIGE technique
Authors: Carvalho, ML Karydas, AG Casaca, C Zarkadas, C Paradellis, T Kokkoris, M Nsouli, B Cunha, AS
Citation: Ml. Carvalho et al., Fluorine determination in human healthy and carious teeth using the PIGE technique, NUCL INST B, 179(4), 2001, pp. 561-567
Determination of the stopping power of channeled protons in SiO2 in the backscattering geometry
Authors: Kokkoris, M Vlastou, R Aslanoglou, XA Kossionides, E Grotzschel, R Paradellis, T
Citation: M. Kokkoris et al., Determination of the stopping power of channeled protons in SiO2 in the backscattering geometry, NUCL INST B, 173(4), 2001, pp. 411-416
Simulations and comparisons of channeling spectra in the p+Si-28 system inthe backscattering geometry
Authors: Aslanoglou, XA Karydas, A Kokkoris, M Kossionides, E Paradellis, T Souliotis, G Vlastou, R
Citation: Xa. Aslanoglou et al., Simulations and comparisons of channeling spectra in the p+Si-28 system inthe backscattering geometry, NUCL INST B, 161, 2000, pp. 524-527
Characterization of optical UV filters using Rutherford backscattering spectroscopy
Authors: Vlastou, R Fokitis, E Maltezos, S Kalliabakos, G Kokkoris, M Kossionides, E
Citation: R. Vlastou et al., Characterization of optical UV filters using Rutherford backscattering spectroscopy, NUCL INST B, 161, 2000, pp. 590-594
Characterization of magnetron sputtering deposited thin films of TiN for use as a metal electrode on TiN/SiO2/Si metal-oxide-semiconductor devices
Authors: Evangelou, EK Konofaos, N Aslanoglou, XA Dimitriadis, CA Patsalas, P Logothetidis, S Kokkoris, M Kossionides, E Vlastou, R Groetschel, R
Citation: Ek. Evangelou et al., Characterization of magnetron sputtering deposited thin films of TiN for use as a metal electrode on TiN/SiO2/Si metal-oxide-semiconductor devices, J APPL PHYS, 88(12), 2000, pp. 7192-7196
Heavy-ion induced damage of crystalline Ge and W in the 0.5-8 A MeV range
Authors: Huber, H Assmann, W Karamian, SA Mieskes, HD Nolte, H Gazis, E Kokkoris, M Kossionides, S Vlastou, R Grotzschel, R Mucklich, A Prusseit, W
Citation: H. Huber et al., Heavy-ion induced damage of crystalline Ge and W in the 0.5-8 A MeV range, NUCL INST B, 146(1-4), 1998, pp. 309-316
Application of proton microprobe and C-12-Rutherford backscattering spectroscopy to the identification of Hg(II)-cations sorbed by granite minerals
Authors: Misaelides, P Godelitsas, A Stephan, A Meijer, J Rolfs, C Harissopulos, S Kokkoris, M Filippidis, A
Citation: P. Misaelides et al., Application of proton microprobe and C-12-Rutherford backscattering spectroscopy to the identification of Hg(II)-cations sorbed by granite minerals, RADIOCH ACT, 83(1), 1998, pp. 43-48
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