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Results:
1-8
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Results: 8
Authors:
Vandooren, A
Conley, JF
Cristoloveanu, S
Mojarradi, M
Kolawa, E
Citation: A. Vandooren et al., Degradation mechanisms in SOI n-channel LDMOSFETs, MICROEL ENG, 59(1-4), 2001, pp. 489-495
Authors:
Vandooren, A
Cristoloveanu, S
Mojarradi, M
Kolawa, E
Citation: A. Vandooren et al., Back-gate and series resistance effects in LDMOSFETs on SOI, IEEE DEVICE, 48(10), 2001, pp. 2410-2416
Authors:
Curicuta, V
Poulain, DE
Alexander, DR
De Angelis, RJ
Gasser, S
Kolawa, E
Citation: V. Curicuta et al., Furnace and laser methods of bonding metals to ceramics: phenomenological investigation, MAT SCI E B, 68(3), 2000, pp. 186-195
Authors:
Gasser, SM
Kolawa, E
Nicolet, MA
Citation: Sm. Gasser et al., Thermal reaction of Pt film with < 110 > GaN epilayer, J VAC SCI A, 17(5), 1999, pp. 2642-2646
Authors:
Gasser, SM
Kolawa, E
Nicolet, MA
Citation: Sm. Gasser et al., Reaction of aluminum-on-titanium bilayer with GaN: Influence of the Al : Ti atomic ratio, J ELEC MAT, 28(8), 1999, pp. 949-954
Authors:
Tsuji, Y
Gasser, SM
Kolawa, E
Nicolet, MA
Citation: Y. Tsuji et al., Texture of copper films on Ta35Si18N47 and Ti33Si23N44 underlayers, THIN SOL FI, 350(1-2), 1999, pp. 1-4
Authors:
Gasser, SM
Kolawa, E
Nicolet, MA
Citation: Sm. Gasser et al., Reactively sputtered Ru-Si-O films, J APPL PHYS, 86(4), 1999, pp. 1974-1981
Authors:
Gasser, SM
Ruiz, R
Kolawa, E
Nicolet, MA
Citation: Sm. Gasser et al., Instability of amorphous Ru-Si-O thin films under thermal oxidation, J ELCHEM SO, 146(4), 1999, pp. 1546-1548
Risultati:
1-8
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