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Citation: L. Kover et al., Determination of overlayer thickness by QUASES analysis of photon-excited KLL Auger spectra of Ni and Cu films, SURF INT AN, 31(4), 2001, pp. 271-279
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Citation: Pb. Barna et al., Formation of polycrystalline and microcrystalline composite thin films by codeposition and surface chemical reaction, SURF COAT, 125(1-3), 2000, pp. 147-150
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Citation: D. Varga et al., Determination of yield ratios of elastically backscattered electrons for deriving inelastic mean free paths in solids, SURF INT AN, 30(1), 2000, pp. 202-206
Authors:
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Citation: B. Lesiak et al., Determination of the inelastic mean free path of electrons in polyaniline samples by elastic peak electron spectroscopy, SURF INT AN, 29(9), 2000, pp. 614-623
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Citation: B. Lesiak et al., Determination of the electron inelastic mean free path in polyacetylene byelastic peak electron spectroscopy using different spectrometers, APPL SURF S, 145, 1999, pp. 168-172
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Kover, L
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Citation: L. Kover et al., Origin of the satellites in the high resolution KLL Auger spectra of the 3d metals, Cu and Ni, and their alloys, SURF SCI, 435, 1999, pp. 833-837