Authors:
WOOD OR
WHITE DL
BJORKHOLM JE
FETTER LE
TENNANT DM
MACDOWELL AA
LAFONTAINE B
KUBIAK GD
Citation: Or. Wood et al., USE OF ATTENUATED PHASE MASKS IN EXTREME-ULTRAVIOLET LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2448-2451
Authors:
KANIA DR
GAINES DP
SWEENEY DS
SOMMARGREN GE
LAFONTAINE B
VERNON SP
TICHENOR DA
BJORKHOLM JE
ZERNIKE F
KESTNER RN
Citation: Dr. Kania et al., PRECISION OPTICAL ASPHERES FOR EXTREME-ULTRAVIOLET LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3706-3708
Authors:
BJORKHOLM JE
MACDOWELL AA
WOOD OR
TAN Z
LAFONTAINE B
TENNANT DM
Citation: Je. Bjorkholm et al., PHASE-MEASURING INTERFEROMETRY USING EXTREME-ULTRAVIOLET RADIATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2919-2922
Authors:
TAN ZQ
MACDOWELL AA
LAFONTAINE B
BJORKHOLM JE
TENNANT D
TAYLOR D
HIMEL M
FREEMAN RR
WASKIEWICZ WK
WINDT DL
SPECTOR S
RAYCHAUDHURI AK
STULEN RH
NG W
CERRINA F
Citation: Zq. Tan et al., AT-WAVELENGTH METROLOGY OF 13-NM LITHOGRAPHY IMAGING OPTICS, Review of scientific instruments, 66(2), 1995, pp. 2241-2243
Authors:
LAFONTAINE B
WHITE DL
WOOD OR
MACDOWELL AA
TAN ZQ
TAYLOR GN
TENNANT DM
HULBERT SL
Citation: B. Lafontaine et al., REAL-TIME OBSERVATIONS OF EXTREME-ULTRAVIOLET AERIAL IMAGES BY FLUORESCENCE MICROIMAGING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3576-3579
Authors:
WOOD OR
BJORKHOLM JE
FETTER L
HIMEL MD
TENNANT DM
MACDOWELL AA
LAFONTAINE B
GRIFFITH JE
TAYLOR GN
WASKIEWICZ WK
WINDT DL
KORTRIGHT JB
GULLIKSON EK
NGUYEN K
Citation: Or. Wood et al., WAVELENGTH DEPENDENCE OF THE RESIST SIDEWALL ANGLE IN EXTREME-ULTRAVIOLET LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3841-3845
Authors:
LAFONTAINE B
BALDIS HA
VILLENEUVE DM
DUNN J
ENRIGHT GD
KIEFFER JC
PEPIN H
ROSEN MD
MATTHEWS DL
MAXON S
Citation: B. Lafontaine et al., CHARACTERIZATION OF LASER-PRODUCED PLASMAS BY ULTRAVIOLET THOMSON SCATTERING, Physics of plasmas, 1(7), 1994, pp. 2329-2341
Authors:
BATON SD
ROUSSEAUX C
MOUNAIX P
LABAUNE C
LAFONTAINE B
PESME D
RENARD N
GARY S
LOUISJACQUET M
BALDIS HA
Citation: Sd. Baton et al., STIMULATED BRILLOUIN-SCATTERING WITH A 1 PS LASER-PULSE IN A PERFORMED UNDERDENSE PLASMA, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 49(5), 1994, pp. 180003602-180003605
Authors:
VILLENEUVE DM
ENRIGHT GD
DUNN J
LAFONTAINE B
BALDIS HA
KIEFFER JC
NANTEL M
Citation: Dm. Villeneuve et al., OPTIMIZATION OF X-RAY LASER GAIN IN NEON-LIKE GERMANIUM PLASMAS, Canadian journal of physics, 72(11-12), 1994, pp. 793-801
Authors:
LAFONTAINE B
DUNN J
BALDIS HA
ENRIGHT GD
VILLENEUVE DM
KIEFFER JC
NANTEL M
PEPIN H
Citation: B. Lafontaine et al., ELECTRON-TEMPERATURE INHOMOGENEITIES ALONG AN X-RAY LASER PLASMA, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 47(1), 1993, pp. 583-590
Authors:
BALDIS HA
VILLENEUVE DM
LAFONTAINE B
ENRIGHT GD
LABAUNE C
BATON S
MOUNAIX P
PESME D
CASANOVA M
ROZMUS W
Citation: Ha. Baldis et al., STIMULATED BRILLOUIN-SCATTERING IN PICOSECOND TIME SCALES - EXPERIMENTS AND MODELING, Physics of fluids. B, Plasma physics, 5(9), 1993, pp. 3319-3327
Authors:
NANTEL M
KIEFFER JC
LAFONTAINE B
PEPIN H
ENRIGHT GD
VILLENEUVE DM
DUNN J
BALDIS HA
PEYRUSSE O
Citation: M. Nantel et al., DYNAMICS OF NE-LIKE POPULATIONS IN THE GERMANIUM X-RAY LASER, Physics of fluids. B, Plasma physics, 5(12), 1993, pp. 4465-4472
Authors:
VILLENEUVE DM
BAKER KL
DRAKE RP
SLEAFORD B
LAFONTAINE B
ESTABROOK K
PRASAD MK
Citation: Dm. Villeneuve et al., OBSERVATION OF PLASMA-WAVES BY THOMSON SCATTERING - SATURATION OF STIMULATED RAMAN-SCATTERING, Physical review letters, 71(3), 1993, pp. 368-371