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Results: 51-60/60
Authors:
GEISZ JF
KUECH TF
LAGALLY MG
CARDONE F
POTEMSKI RM
Citation: Jf. Geisz et al., FILM STRESS OF SPUTTERED W C MULTILAYERS AND STRAIN RELAXATION UPON ANNEALING/, Journal of applied physics, 75(3), 1994, pp. 1530-1533
Authors:
KITAMURA N
SWARTZENTRUBER BS
LAGALLY MG
WEBB MB
Citation: N. Kitamura et al., VARIABLE-TEMPERATURE STM MEASUREMENTS OF STEP KINETICS ON SI(001), Physical review. B, Condensed matter, 48(8), 1993, pp. 5704-5707
Authors:
SWARTZENTRUBER BS
KITAMURA N
LAGALLY MG
WEBB MB
Citation: Bs. Swartzentruber et al., BEHAVIOR OF STEPS ON SI(001) AS A FUNCTION OF VICINALITY, Physical review. B, Condensed matter, 47(20), 1993, pp. 13432-13441
Authors:
LAGALLY MG
Citation: Mg. Lagally, ATOM MOTION ON SURFACES, Physics today, 46(11), 1993, pp. 24-31
Authors:
HELLER EJ
ZHANG ZY
LAGALLY MG
Citation: Ej. Heller et al., STEP AND KINK ENERGETICS ON GAAS(001), Physical review letters, 71(5), 1993, pp. 743-746
Authors:
WU F
JALOVIAR SG
SAVAGE DE
LAGALLY MG
Citation: F. Wu et al., ROUGHENING OF STEPS DURING HOMOEPITAXIAL GROWTH ON SI(001), Physical review letters, 71(25), 1993, pp. 4190-4193
Authors:
ZHANG ZY
CHEN H
BOLDING BC
LAGALLY MG
Citation: Zy. Zhang et al., VACANCY DIFFUSION ON SI(100)-(2X1), Physical review letters, 71(22), 1993, pp. 3677-3680
Authors:
KITAMURA N
LAGALLY MG
WEBB MB
Citation: N. Kitamura et al., REAL-TIME OBSERVATIONS OF VACANCY DIFFUSION ON SI(001)-(2X1) BY SCANNING-TUNNELING-MICROSCOPY, Physical review letters, 71(13), 1993, pp. 2082-2085
Authors:
PHANG YH
SAVAGE DE
KARIOTIS R
LAGALLY MG
Citation: Yh. Phang et al., X-RAY-DIFFRACTION MEASUREMENT OF PARTIALLY CORRELATED INTERFACIAL ROUGHNESS IN MULTILAYERS, Journal of applied physics, 74(5), 1993, pp. 3181-3188
Authors:
SAVAGE DE
PHANG YH
ROWND JJ
MACKAY JF
LAGALLY MG
Citation: De. Savage et al., DETERMINATION OF INTERFACIAL ROUGHNESS CORRELATION IN W C MULTILAYER FILMS - COMPARISON USING SOFT AND HARD X-RAY-DIFFRACTION/, Journal of applied physics, 74(10), 1993, pp. 6158-6164