ACNP - Italian Periodicals Catalogue

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Results: 1-11 |

Results: 11

X-RAY-DIFFRACTION AND REFLECTOMETRY STUDIES OF POROUS SILICON - N-TYPE LAYERS AND HOLOGRAPHIC GRATINGS

Authors: CHAMARD V DOLINO G LERONDEL G SETZU S

Citation: V. Chamard et al., X-RAY-DIFFRACTION AND REFLECTOMETRY STUDIES OF POROUS SILICON - N-TYPE LAYERS AND HOLOGRAPHIC GRATINGS, Physica. B, Condensed matter, 248, 1998, pp. 101-103

TEMPERATURE EFFECT ON THE ROUGHNESS OF THE FORMATION INTERFACE OF P-TYPE POROUS SILICON

Authors: SETZU S LERONDEL G ROMESTAIN R

Citation: S. Setzu et al., TEMPERATURE EFFECT ON THE ROUGHNESS OF THE FORMATION INTERFACE OF P-TYPE POROUS SILICON, Journal of applied physics, 84(6), 1998, pp. 3129-3133

HOLOGRAPHY IN POROUS SILICON

Authors: LERONDEL G SETZU S THONISSEN M ROMESTAIN R

Citation: G. Lerondel et al., HOLOGRAPHY IN POROUS SILICON, Journal of imaging science and technology, 41(5), 1997, pp. 468-473

OPTOSENSORIC BASED ON AMORPHOUS AND POROU S SILICON

Authors: STIEBIG H THONISSEN M KRUGER M KNIPP D LERONDEL G WAGNER H LUTH H

Citation: H. Stiebig et al., OPTOSENSORIC BASED ON AMORPHOUS AND POROU S SILICON, TM. Technisches Messen, 64(4), 1997, pp. 136-142

ANALYSIS OF THE DEPTH HOMOGENEITY OF P-PS BY REFLECTANCE MEASUREMENTS

Authors: THONISSEN M BERGER MG BILLAT S ARENSFISCHER R KRUGER M LUTH H THEISS W HILLBRICH S GROSSE P LERONDEL G FROTSCHER U

Citation: M. Thonissen et al., ANALYSIS OF THE DEPTH HOMOGENEITY OF P-PS BY REFLECTANCE MEASUREMENTS, Thin solid films, 297(1-2), 1997, pp. 92-96

QUANTITATIVE-ANALYSIS OF THE LIGHT-SCATTERING EFFECT ON POROUS SILICON OPTICAL MEASUREMENTS

Authors: LERONDEL G ROMESTAIN R

Citation: G. Lerondel et R. Romestain, QUANTITATIVE-ANALYSIS OF THE LIGHT-SCATTERING EFFECT ON POROUS SILICON OPTICAL MEASUREMENTS, Thin solid films, 297(1-2), 1997, pp. 114-117

POROUS SILICON ANISOTROPY INVESTIGATED BY GUIDED LIGHT

Authors: MIHALCESCU I LERONDEL G ROMESTAIN R

Citation: I. Mihalcescu et al., POROUS SILICON ANISOTROPY INVESTIGATED BY GUIDED LIGHT, Thin solid films, 297(1-2), 1997, pp. 245-249

ROUGHNESS OF THE POROUS SILICON DISSOLUTION INTERFACE

Authors: LERONDEL G ROMESTAIN R BARRET S

Citation: G. Lerondel et al., ROUGHNESS OF THE POROUS SILICON DISSOLUTION INTERFACE, Journal of applied physics, 81(9), 1997, pp. 6171-6178

POROUS SILICON LATERAL SUPERLATTICES

Authors: LERONDEL G ROMESTAIN R VIAL JC THONISSEN M

Citation: G. Lerondel et al., POROUS SILICON LATERAL SUPERLATTICES, Applied physics letters, 71(2), 1997, pp. 196-198

LIGHT-SCATTERING FROM POROUS SILICON

Authors: LERONDEL G ROMESTAIN R MADEORE F MULLER F

Citation: G. Lerondel et al., LIGHT-SCATTERING FROM POROUS SILICON, Thin solid films, 276(1-2), 1996, pp. 80-83

MOLECULAR-BEAM EPITAXIAL-GROWTH AND CHARACTERIZATION OF (100) HGSE ONGAAS

Authors: BECKER CR HE L EINFELDT S WU YS LERONDEL G HEINKE H OEHLING S BICKNELLTASSIUS RN LANDWEHR G

Citation: Cr. Becker et al., MOLECULAR-BEAM EPITAXIAL-GROWTH AND CHARACTERIZATION OF (100) HGSE ONGAAS, Journal of crystal growth, 127(1-4), 1993, pp. 331-334

Risultati: 1-11 |